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dc.contributor.authorAltet Sanahujes, Josep
dc.contributor.authorMateo Peña, Diego
dc.contributor.authorGómez Salinas, Dídac
dc.contributor.authorPerpiñà, Xavier
dc.contributor.authorJordà, Xavier
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2013-02-18T13:32:14Z
dc.date.created2012
dc.date.issued2012
dc.identifier.citationAltet, J. [et al.]. DC temperature measurements for power gain monitoring in RF power amplifiers. A: IEEE International Test Conference. "2012 IEEE International Test Conference (ITC)". Anaheim, CA: IEEE, 2012, p. 1-8.
dc.identifier.isbn978-1-4577-0152-8/
dc.identifier.urihttp://hdl.handle.net/2117/17832
dc.description.abstractIn this paper we demonstrate that the steady state temperature increase due to the power dissipated by the circuit under test can be used as observable to test the gain of a 2GHz linear class A Power Amplifier. As a proof of concept, we use two strategies to monitor the temperature: a temperature sensor embedded within the same silicon die, which can be used for a BIST approach, and an Infra Red camera, with applications to failure analysis and product debugging.
dc.format.extent8 p.
dc.language.isoeng
dc.publisherIEEE
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica
dc.subject.lcshPower amplifiers
dc.titleDC temperature measurements for power gain monitoring in RF power amplifiers
dc.typeConference report
dc.subject.lemacAmplificadors de potència
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.identifier.doi10.1109/TEST.2012.6401589
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6401589&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6401589
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac11146560
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorAltet, J.; Mateo, D.; Gómez, D.; Perpiñà, X.; Jordà, X.
local.citation.contributorIEEE International Test Conference
local.citation.pubplaceAnaheim, CA
local.citation.publicationName2012 IEEE International Test Conference (ITC)
local.citation.startingPage1
local.citation.endingPage8


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