Mostra el registre d'ítem simple
Contactless electrical resistance of 2D materials using a rutile resonator
dc.contributor.author | Arcos Gutiérrez, David |
dc.contributor.author | Krkotic, Patrick |
dc.contributor.author | O'Callaghan Castellà, Juan Manuel |
dc.contributor.author | Pont, Montse |
dc.contributor.author | Ametller Congost, Lluís |
dc.contributor.author | Ferrer Anglada, Núria |
dc.contributor.other | Universitat Politècnica de Catalunya. Doctorat en Física Computacional i Aplicada |
dc.contributor.other | Universitat Politècnica de Catalunya. Doctorat en Teoria del Senyal i Comunicacions |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Física |
dc.date.accessioned | 2020-02-11T13:41:13Z |
dc.date.available | 2020-12-30T01:27:22Z |
dc.date.issued | 2019-12-12 |
dc.identifier.citation | Arcos, D. [et al.]. Contactless electrical resistance of 2D materials using a rutile resonator. "Physica status solidi B. Basic solid state physics", 12 Desembre 2019, vol. 256, núm. 12, p. 1-6. |
dc.identifier.issn | 0370-1972 |
dc.identifier.uri | http://hdl.handle.net/2117/177461 |
dc.description.abstract | Measuring the electrical surface resistance of 2D materials without contact can provide a method for obtaining their intrinsic characterisation. The aim of this paper is to show that a rutile dielectric resonator (RDR) can be used to measure the electrical surface resistance of conducting coatings deposited on substrates, at the resonance frequency. Moreover, it is known that the substrate exerts a strong influence capable of intrinsically modify the properties of the 2D materials, as found in graphene. The RDR method is used for different samples of metals (Cu, Mo, Ti, brass), carbon nanotubes (bucky paper), a film of compacted graphene flakes, a film of compacted graphene oxide flakes and graphene obtained by CVD on different substrates (SiO2/Si, quartz and PET). The results show that reasonable values can be obtained for thin conducting materials with a thickness of not less than a few micrometers. In the case of graphene grown on a substrate, the presence of graphene is clearly detected but the resistivity value cannot be extracted. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Física |
dc.subject.lcsh | Graphene |
dc.subject.other | Graphene |
dc.subject.other | Bucky paper |
dc.subject.other | Rutile resonator |
dc.subject.other | High frequency conductivity |
dc.title | Contactless electrical resistance of 2D materials using a rutile resonator |
dc.type | Article |
dc.subject.lemac | Grafè |
dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
dc.contributor.group | Universitat Politècnica de Catalunya. SIMCON - First-principles approaches to condensed matter physics: quantum effects and complexity |
dc.identifier.doi | 10.1002/pssb.201900428 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | https://onlinelibrary.wiley.com/doi/abs/10.1002/pssb.201900428?af=R |
dc.rights.access | Open Access |
local.identifier.drac | 26213563 |
dc.description.version | Postprint (author's final draft) |
local.citation.author | Arcos, D.; Krkotic, P.; O'callaghan, J.; Pont, M.; Ametller, L.; Ferrer-Anglada, N. |
local.citation.publicationName | Physica status solidi B. Basic solid state physics |
local.citation.volume | 256 |
local.citation.number | 12 |
local.citation.startingPage | 1 |
local.citation.endingPage | 6 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [2.208]
-
Articles de revista [2.526]
-
Articles de revista [383]
-
Articles de revista [211]
-
Articles de revista [159]
-
Articles de revista [200]