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Impact of laser attacks on the switching behavior of RRAM devices

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Arumi Delgado, DanielMés informacióMés informacióMés informació
Manich Bou, SalvadorMés informacióMés informacióMés informació
Gómez Pau, ÁlvaroMés informacióMés informacióMés informació
Rodríguez Montañés, RosaMés informacióMés informacióMés informació
Montilla, Víctor
Hernández, David
Bargalló González, Mireia
Campabadal, Francesca
Document typeArticle
Defense date2020-01-20
Rights accessOpen Access
Attribution-NonCommercial 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial 3.0 Spain
Abstract
The ubiquitous use of critical and private data in electronic format requires reliable and secure embedded systems for IoT devices. In this context, RRAMs (Resistive Random Access Memories) arises as a promising alternative to replace current memory technologies. However, their suitability for this kind of application, where the integrity of the data is crucial, is still under study. Among the different typology of attacks to recover information of secret data, laser attack is one of the most common due to its simplicity. Some preliminary works have already addressed the influence of laser tests on RRAM devices. Nevertheless, the results are not conclusive since different responses have been reported depending on the circuit under testing and the features of the test. In this paper, we have conducted laser tests on individual RRAM devices. For the set of experiments conducted, the devices did not show faulty behaviors. These results contribute to the characterization of RRAMs and, together with the rest of related works, are expected to pave the way for the development of suitable countermeasures against external attacks.
CitationArumi, D. [et al.]. Impact of laser attacks on the switching behavior of RRAM devices. "Electronics", 20 Gener 2020, vol. 9, núm. 1, p. 1-9. 
URIhttp://hdl.handle.net/2117/175992
DOI10.3390/electronics9010200
ISSN2079-9292
Publisher versionhttps://www.mdpi.com/2079-9292/9/1/200
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  • Departament d'Enginyeria Electrònica - Articles de revista [1.531]
  • Departament d'Enginyeria Elèctrica - Articles de revista [730]
  • QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat - Articles de revista [73]
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