Origin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor
dc.contributor.author | Ros Costals, Eloi |
dc.contributor.author | Puigdollers i González, Joaquim |
dc.contributor.author | Ortega Villasclaras, Pablo Rafael |
dc.contributor.author | Voz Sánchez, Cristóbal |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2020-01-22T18:46:02Z |
dc.date.available | 2020-01-22T18:46:02Z |
dc.date.issued | 2020-01-09 |
dc.identifier.citation | Ros, E. [et al.]. Origin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor. "IEEE Journal of the Electron Devices Society", 9 Gener 2020. |
dc.identifier.issn | 2168-6734 |
dc.identifier.uri | http://hdl.handle.net/2117/175469 |
dc.description | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
dc.description.abstract | In this work, we have fabricated and studied p-type picene thin-film transistors. Although the devices exhibited good electrical performance with high field-effect mobility (up to 1.3 cm 2 /V·s) and on/off ratios above 10 5 , the output electric characteristics of the devices exhibited a Negative Differential Resistance for higher drain-source voltage. Finally, a possible explanation for this phenomenon is developed. |
dc.language.iso | eng |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) |
dc.subject | Àrees temàtiques de la UPC::Física::Física de l'estat sòlid::Semiconductors |
dc.subject.lcsh | Thin films |
dc.subject.other | OTFT |
dc.subject.other | NDR |
dc.subject.other | Organic semiconductors |
dc.subject.other | Density of states |
dc.title | Origin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor |
dc.type | Article |
dc.subject.lemac | Capes fines |
dc.contributor.group | Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
dc.identifier.doi | 10.1109/JEDS.2020.2965213 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | https://ieeexplore.ieee.org/document/8714731 |
dc.rights.access | Open Access |
local.identifier.drac | 26609585 |
dc.description.version | Postprint (author's final draft) |
dc.relation.projectid | info:eu-repo/grantAgreement/AEI/2PE/ENE2017-87671-C3-2-R |
dc.relation.projectid | info:eu-repo/grantAgreement/MINECO/1PE/ENE2016-78933-C4-1-R |
local.citation.author | Ros, E.; Puigdollers, J.; Ortega, P.; Voz, C. |
local.citation.publicationName | IEEE Journal of the Electron Devices Society |
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