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Topology of technology graphs: small world patterns in electronic circuits

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10.1103/PhysRevE.64.046119
 
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hdl:2117/175368

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Ferrer Cancho, RamonMés informacióMés informacióMés informació
Janssen, Christiaan
Vicente Solé, Ricardo
Document typeArticle
Defense date2001-10
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
Recent theoretical studies and extensive data analyses have revealed a common feature displayed by biological, social, and technological networks: the presence of small world patterns. Here we analyze this problem by using several graphs obtained from one of the most common technological systems: electronic circuits. It is shown that both analogic and digital circuits exhibit small world behavior. We conjecture that the small world pattern arises from the compact design in which many elements share a small, close physical neighborhood plus the fact that the system must define a single connected component (which requires shortcuts connecting different integrated clusters). The degree distributions displayed are consistent with a conjecture concerning the sharp cutoffs associated to the presence of costly connections [Amaral et al., Proc. Natl. Acad. Sci. USA 97, 11 149 (2000)], thus providing a limit case for the classes of universality of small world patterns from real, artificial networks. The consequences for circuit design are outlined.
CitationFerrer-i-Cancho, R.; Janssen, C.; Vicente, R. Topology of technology graphs: small world patterns in electronic circuits. "Physical review E: statistical, nonlinear, and soft matter physics", Octubre 2001, vol. 64, núm. 4, p. 046119-1-046119-5. 
URIhttp://hdl.handle.net/2117/175368
DOI10.1103/PhysRevE.64.046119
ISSN1539-3755
Publisher versionhttps://journals.aps.org/pre/abstract/10.1103/PhysRevE.64.046119
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