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dc.contributor.authorHalpaap, Donatus
dc.contributor.authorTiana Alsina, Jordi
dc.contributor.authorVilaseca Ricart, Meritxell
dc.contributor.authorMasoller Alonso, Cristina
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Física
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Òptica i Optometria
dc.date.accessioned2019-09-18T12:02:02Z
dc.date.issued2019
dc.identifier.citationHalpaap, D. [et al.]. Characterization of speckle patterns generated by a semiconductor laser with optical feedback for speckle reduction in retinal imaging instruments. A: European Conferences on Biomedical Optics. "Proceedings of SPIE 11078: Optical Coherence Imaging Techniques and Imaging in Scattering Media III". Washington: International Society for Photo-Optical Instrumentation Engineers (SPIE), 2019, p. 110782A-1-110782A-3.
dc.identifier.urihttp://hdl.handle.net/2117/168367
dc.description.abstractWe study experimentally the operating conditions of a semiconductor laser diode subjected to different amounts of optical feedback in order to find a stable and cost-efficient solution for speckle reduction in double-pass retinal imaging.
dc.language.isoeng
dc.publisherInternational Society for Photo-Optical Instrumentation Engineers (SPIE)
dc.subjectÀrees temàtiques de la UPC::Ciències de la visió
dc.subject.lcshEye--Accommodation and refraction
dc.subject.lcshOptical measurements
dc.subject.lcshRetina
dc.subject.otherSpeckle reduction
dc.subject.otherDouble pass imaging
dc.subject.otherEye optical quality
dc.titleCharacterization of speckle patterns generated by a semiconductor laser with optical feedback for speckle reduction in retinal imaging instruments
dc.typeConference lecture
dc.subject.lemacUlls -- Acomodació i refracció
dc.subject.lemacÒptica -- Mesuraments
dc.subject.lemacRetina
dc.contributor.groupUniversitat Politècnica de Catalunya. DONLL - Dinàmica no Lineal, Òptica no Lineal i Làsers
dc.contributor.groupUniversitat Politècnica de Catalunya. GREO - Grup de Recerca en Enginyeria Òptica
dc.identifier.doi10.1117/12.2526761
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/11078/110782A/Characterization-of-speckle-patterns-generated-by-a-semiconductor-laser-with/10.1117/12.2526761.short
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac25805197
dc.description.versionPostprint (published version)
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/675512/EU/Advanced BiomEdical OPTICAL Imaging and Data Analysis/BE-OPTICAL
dc.date.lift10000-01-01
local.citation.authorHalpaap, D.; Tiana-Alsina, J.; Vilaseca, M.; Masoller, C.
local.citation.contributorEuropean Conferences on Biomedical Optics
local.citation.pubplaceWashington
local.citation.publicationNameProceedings of SPIE 11078: Optical Coherence Imaging Techniques and Imaging in Scattering Media III
local.citation.startingPage110782A-1
local.citation.endingPage110782A-3


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