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dc.contributor.authorSantos Hernández, Sergio
dc.contributor.authorGadelrab,, K.
dc.contributor.authorBarcons Xixons, Víctor
dc.contributor.authorStefancich, M.
dc.contributor.authorChiesa, Matteo
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics
dc.identifier.citationSantos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12.
dc.description.abstractA formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample deformation with picometer resolution.
dc.format.extent12 p.
dc.subjectÀrees temàtiques de la UPC::Física
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshAtomic force microscopy
dc.subject.otherDissipative process
dc.subject.otherEnergy hysteresis
dc.subject.otherPicometer resolution
dc.subject.otherSample deformation
dc.subject.otherUnknown quantity
dc.titleQuantification of dissipation and deformation in ambient atomic force microscopy
dc.subject.lemacMicroscòpia de força atòmica
dc.contributor.groupUniversitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control
dc.rights.accessRestricted access - publisher's policy
dc.description.versionPostprint (published version)
upcommons.citation.authorSantos, S.; Gadelrab,, K.; Barcons, V.; Stefancich, M.; Chiesa, M.
upcommons.citation.publicationNameNew journal of physics
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