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dc.contributor.authorRos, Eloi
dc.contributor.authorPuigdollers i González, Joaquim
dc.contributor.authorOrtega Villasclaras, Pablo Rafael
dc.contributor.authorVoz Sánchez, Cristóbal
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2019-07-30T07:34:58Z
dc.date.available2019-07-30T07:34:58Z
dc.date.issued2019
dc.identifier.citationRos, E. [et al.]. Origin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor. A: Latin American Electron Devices Conference. "2019 Latin American Electron Devices Conference (LAEDC 2019): Armenia, Colombia: 24-27 February 2019". Institute of Electrical and Electronics Engineers (IEEE), 2019, p. 1-4.
dc.identifier.isbn9781728122175
dc.identifier.urihttp://hdl.handle.net/2117/167067
dc.description© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes,creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.description.abstractIn this work, we have fabricated and studied p-type picene thin-film transistors. Although the devices exhibited good electrical performance with high field-effect mobility (up to 1.3 cm2/V¿s) and on/off ratios above 105, the output electric characteristics of the devices exhibited a Negative Differential Resistance for higher drain-source voltage. Finally, a possible explanation for this phenomenon is developed.
dc.format.extent4 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.subjectÀrees temàtiques de la UPC::Física::Física de l'estat sòlid::Semiconductors
dc.subject.lcshOrganic semiconductors
dc.subject.otherOTFT
dc.subject.otherNDR
dc.subject.otherOrganic semiconductors
dc.subject.otherNon ideal output
dc.titleOrigin of the negative differential resistance in the output characteristics of a picene-based thin-film transistor
dc.typeConference report
dc.subject.lemacSemiconductors orgànics
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1109/LAED.2019.8714731
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://ieeexplore.ieee.org/document/8714731
dc.rights.accessOpen Access
local.identifier.drac23964743
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/MINECO/1PE/ENE2016-78933-C4-1-R
dc.relation.projectidinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2013-2016/ENE2017-87671-C3-2-R/ES/DISPOSITIVOS HIBRIDOS DE SILICIO%2FCALCOGENURO DE CAPA DELGADA PARA TECNOLOGIAS FOTOVOLTAICOS SOSTENIBLES DE BAJO COSTE Y MUY ALTA EFICIENCIA/
local.citation.authorRos, E.; Puigdollers, J.; Ortega, P.; Voz, C.
local.citation.contributorLatin American Electron Devices Conference
local.citation.publicationName2019 Latin American Electron Devices Conference (LAEDC 2019): Armenia, Colombia: 24-27 February 2019
local.citation.startingPage1
local.citation.endingPage4


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