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On line monitoring of RF power amplifiers with embedded temperature sensors
| dc.contributor.author | Altet Sanahujes, Josep |
| dc.contributor.author | Mateo Peña, Diego |
| dc.contributor.author | Gómez Salinas, Dídac |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2012-10-05T10:54:17Z |
| dc.date.created | 2012 |
| dc.date.issued | 2012 |
| dc.identifier.citation | Altet, J.; Mateo, D.; Gómez, D. On line monitoring of RF power amplifiers with embedded temperature sensors. A: IEEE International On-Line Testing Symposium. "2012 IEEE 18th International On-Line Testing Symposium (IOLTS), Sitges, Spain, June 27-29, 2012". Sitges, Barcelona: IEEE, 2012, p. 1-5. |
| dc.identifier.isbn | 978-1-4673-2084-9 |
| dc.identifier.uri | http://hdl.handle.net/2117/16657 |
| dc.description.abstract | In the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present experimental results obtained with a 65 nm CMOS IC that contains a 2GHz linear class A Power Amplifier and a very simple differential temperature sensor. Results show that the PA output power can be tracked from DC temperature measurements. |
| dc.format.extent | 5 p. |
| dc.language.iso | eng |
| dc.publisher | IEEE |
| dc.subject.lcsh | Power amplifiers |
| dc.title | On line monitoring of RF power amplifiers with embedded temperature sensors |
| dc.type | Conference report |
| dc.subject.lemac | Amplificadors (Electrònica) |
| dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
| dc.description.peerreviewed | Peer Reviewed |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 10706347 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Altet, J.; Mateo, D.; Gómez, D. |
| local.citation.contributor | IEEE International On-Line Testing Symposium |
| local.citation.pubplace | Sitges, Barcelona |
| local.citation.publicationName | 2012 IEEE 18th International On-Line Testing Symposium (IOLTS), Sitges, Spain, June 27-29, 2012 |
| local.citation.startingPage | 1 |
| local.citation.endingPage | 5 |