Mostra el registre d'ítem simple
Cracks tamed
dc.contributor.author | Pons Rivero, Antonio Javier |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Física i Enginyeria Nuclear |
dc.date.accessioned | 2012-06-09T09:30:47Z |
dc.date.created | 2012-05-10 |
dc.date.issued | 2012-05-10 |
dc.identifier.citation | Pons, A. J. Cracks tamed. "Nature", 10 Maig 2012, vol. 485, p. 177-178. |
dc.identifier.issn | 0028-0836 |
dc.identifier.uri | http://hdl.handle.net/2117/15994 |
dc.description.abstract | Crack propagation in materials is rarely welcome. But carefully engineered cracks produced during the deposition of a film on silicon can be used to efficiently create pre-designed patterns of nanometre-scale channels. |
dc.format.extent | 2 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria dels materials::Assaig de materials |
dc.subject.lcsh | Fracture mechanics |
dc.title | Cracks tamed |
dc.type | Article |
dc.subject.lemac | Fractures, Mecànica de |
dc.contributor.group | Universitat Politècnica de Catalunya. DONLL - Dinàmica no Lineal, Òptica no Lineal i Làsers |
dc.identifier.doi | 10.1038/485177a |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://www.nature.com/nature/journal/v485/n7397/full/485177a.html |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 10367052 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Pons, A. J. |
local.citation.publicationName | Nature |
local.citation.volume | 485 |
local.citation.startingPage | 177 |
local.citation.endingPage | 178 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [341]
-
Articles de revista [603]