Show simple item record

dc.contributor.authorSera, Dezso
dc.contributor.authorMathe, L.
dc.contributor.authorKerekes, Tamas
dc.contributor.authorTeodorescu, Remus
dc.contributor.authorRodríguez Cortés, Pedro
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Elèctrica
dc.identifier.citationSera, D. [et al.]. A low-disturbance diagnostic function integrated in the PV arrays' MPPT algorithm. A: IEEE International Conference on Industrial Electronics. "IECON 2011 - IEEE Industrial Electronics Conference". Melbourne: IEEE, 2011, p. 2456-2460.
dc.description.abstractThis paper focuses on the estimation of series resistance changes for flat silicone PV panels or arrays during operation, without moving the operating point far away from the Maximum Power Point1. The method is based on the measurement of the slope of the IV curve at a current level that differs from the short-circuit current with a fixed value, regardless of irradiance conditions. The method causes less power loss and power ripple due to measurements and it is easily integrated in a hill-climbing MPPT algorithm.
dc.format.extent5 p.
dc.subjectÀrees temàtiques de la UPC::Energies::Energia solar fotovoltaica
dc.subjectÀrees temàtiques de la UPC::Energies::Energia elèctrica::Electricitat
dc.subject.lcshPhotovoltaic power systems
dc.subject.lcshSolar energy
dc.titleA low-disturbance diagnostic function integrated in the PV arrays' MPPT algorithm
dc.typeConference report
dc.subject.lemacEnergia solar fotovoltaica
dc.subject.lemacSistemes de potencia fotovoltaica
dc.contributor.groupUniversitat Politècnica de Catalunya. SEER - Sistemes Elèctrics d'Energia Renovable
dc.description.peerreviewedPeer Reviewed
dc.rights.accessRestricted access - publisher's policy
dc.description.versionPostprint (published version)
local.citation.authorSera, D.; Mathe, L.; Kerekes, T.; Teodorescu, R.; Rodriguez, P.
local.citation.contributorIEEE International Conference on Industrial Electronics
local.citation.publicationNameIECON 2011 - IEEE Industrial Electronics Conference

Files in this item


This item appears in the following Collection(s)

Show simple item record

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder