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dc.contributor.authorGarcía Almudéver, Carmen
dc.contributor.authorRubio Sola, Jose Antonio
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2011-12-21T09:21:22Z
dc.date.available2011-12-21T09:21:22Z
dc.date.created2011
dc.date.issued2011
dc.identifier.citationGarcía, C.; Rubio, J. A comparative variability analysis for CMOS and CNFET 6T SRAM cells. A: IEEE International Midwest Symposium on Circuits and Systems. "International Midwest Symposium on Circuits and Systems (MWSCAS)". 2011, p. 1-4.
dc.identifier.isbn978-1-61284-856-3
dc.identifier.urihttp://hdl.handle.net/2117/14292
dc.description.abstractStatistical device variability may be a limiting factor for further miniaturizing nodes in silicon bulk CMOS technology. On the other hand, in novel technologies such as Carbon Nanotubes Field Effect Transistors (CNFETs), the device variability is also present and is mainly due to imperfections inherent in current carbon nanotube (CNT) growth methods. The goal of this paper is to evaluate the impact of the main sources of variability in conventional MOSFET and CNFET 6T SRAM cells through the consideration of random threshold voltage process variations.
dc.format.extent4 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Microelectrònica::Circuits integrats
dc.subject.lcshCMOS
dc.subject.lcshMOSFET
dc.subject.lcshCNFET
dc.subject.lcshSRAM chips
dc.subject.lcshCarbon nanotubes
dc.titleA comparative variability analysis for CMOS and CNFET 6T SRAM cells
dc.typeConference report
dc.subject.lemacNanotubs de carboni
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.identifier.doi10.1109/MWSCAS.2011.6026572
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6026572&tag=1
dc.rights.accessRestricted access - publisher's policy
drac.iddocument8790718
dc.description.versionPostprint (published version)
upcommons.citation.authorGarcía, C.; Rubio, J.
upcommons.citation.contributorIEEE International Midwest Symposium on Circuits and Systems
upcommons.citation.publishedtrue
upcommons.citation.publicationNameInternational Midwest Symposium on Circuits and Systems (MWSCAS)
upcommons.citation.startingPage1
upcommons.citation.endingPage4


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