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dc.contributor.authorVallbe, Bernat
dc.contributor.authorBalcells Sendra, Josep
dc.contributor.authorBogónez Franco, Francisco
dc.contributor.authorMata Diaz, Jorge
dc.contributor.authorGago Barrio, Javier
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Telemàtica
dc.date.accessioned2011-11-16T08:28:14Z
dc.date.available2011-11-16T08:28:14Z
dc.date.created2011
dc.date.issued2011
dc.identifier.citationVallbe, B. [et al.]. Immunity of power line communications (PLC) in disturbed networks. A: IEEE International Symposium on Industrial Electronics (ISIE). "IEEE International Symposium on Industrial Electronics". Gdansk: 2011, p. 1621-1625.
dc.identifier.isbn978-1-4244-9310-4
dc.identifier.urihttp://hdl.handle.net/2117/13918
dc.description.abstractThis paper presents an analysis of electromagnetic immunity of energy metering devices, using broadband power line communications (PLC) in low voltage (LV) supply networks with high levels of disturbance. Several tests have been carried out to characterize the behavior of PLC modems and couplers in presence of the most common types of disturbances and electromagnetic interferences (EMI) which can be expected in LV distribution networks. The method exposed allows repeat the tests with different modems, communications wires and couplers. Thus it is possible to compare different elements between them and choose the best for every occasion.
dc.format.extent5 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
dc.subject.lcshElectromagnetic interference
dc.titleImmunity of power line communications (PLC) in disturbed networks
dc.typeConference report
dc.subject.lemacInterferència electromagnètica
dc.contributor.groupUniversitat Politècnica de Catalunya. SERTEL - Serveis Telemàtics
dc.contributor.groupUniversitat Politècnica de Catalunya. (TIEG) - Terrassa Industrial Electronics Group
dc.identifier.doi10.1109/ISIE.2011.5984403
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5984403
dc.rights.accessOpen Access
local.identifier.drac8602701
dc.description.versionPostprint (author’s final draft)
local.citation.authorVallbe, B.; Balcells, J.; Bogonez, F.; Mata, J.; Gago, J.
local.citation.contributorIEEE International Symposium on Industrial Electronics (ISIE)
local.citation.pubplaceGdansk
local.citation.publicationNameIEEE International Symposium on Industrial Electronics
local.citation.startingPage1621
local.citation.endingPage1625


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