Show simple item record

dc.contributor.authorTorrents Dolz, Josep M.
dc.contributor.authorPallàs Areny, Ramon
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2007-11-29T12:24:46Z
dc.date.available2007-11-29T12:24:46Z
dc.date.created2005-10-31
dc.date.issued2005-10-31
dc.identifier.citationTorrents, J.M.; Pallas R. Error analysis in two-terminal impedance measurements with residual correction. IEEE Transactions on Instrumentation and Measurement. 2005, vol 54 núm 5, p. 2113-2116
dc.identifier.issn0018-9456
dc.identifier.urihttp://hdl.handle.net/2117/1388
dc.description.abstractResidual impedance correction in impedance analyzers when using an asymmetrical test fixture needs three reference measurements, usually open circuit, short circuit, and load (meaning an impedance close to the impedance under test). This paper provides an error estimate for impedance measurements that apply a simple open/short correction in spite of using an asymmetrical test fixture. Experimental results show that the minimal error is obtained for impedance values close to the geometric mean of the short-circuit and open-circuit impedances, and that the theoretical prediction is indeed an upper limit for the actual error.
dc.format.extent2113-2116
dc.language.isoeng
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.subjectÀrees temàtiques de la UPC::Enginyeria biomèdica::Electrònica biomèdica
dc.subject.lcshImpedance (Electricity)
dc.subject.lcshError analysis (Mathematics)
dc.subject.otherElectric impedance measurement
dc.subject.otherError analysis
dc.subject.otherResidual impedance correction
dc.subject.otherImpedance analyzers
dc.subject.otherAsymmetrical test fixture
dc.subject.otherReference measurements
dc.subject.otherError estimation
dc.subject.otherOpen/short correction
dc.subject.otherShort-circuit impedance
dc.subject.otherOpen-circuit impedances
dc.titleError analysis in two-terminal impedance measurements with residual correction
dc.typeArticle
dc.subject.lemacImpedància (Electricitat)
dc.subject.lemacAnàlisi d'error (Matemàtica)
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.contributor.groupUniversitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
dc.relation.projectidcttTAP99-0742
local.personalitzacitaciotrue


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder