Design of a test system for embedded processor boards

Abstract

One of the most important part during the manufacturing process of an embedded system board is the final test. This process will guarantee that each of its parts that theboard contains works correctly and ensure the embedded system board is ready. Thecomplete test system is composed by different test that will check all the parts that compose the embedded board. This parts goes from the internal chip to external peripherals. These test need to be robust and completely autonomous.The test process is often used as the last part of the manufactured process and an operator is the responsible of set up manually the necessary connection and supervise the progression and results. In this project it will be proposed a test system which reduce as much as possible the testing time in order to reduce the production cost of each board. This system will be designed for some particular embedded system boards but it will be adaptive to simply export it to new embedded system boards