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dc.contributor.authorPous Solà, Marc
dc.contributor.authorSilva Martínez, Fernando
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.identifier.citationPous, M.; Silva, F. Alternative conducted emission measurements on mains without LISNs. "IEEE Electromagnetic Compatibility Magazine", 1 Desembre 2015, vol. 4, núm. 4, p. 58-65.
dc.description.abstractConducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the EUT (Equipment Under Test) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods is inevitable in industry. In this paper, we made conducted measurements on actual EUTs in alternative environments whose impedances are different from the standard LISN impedance and continued to establish the fundamentals of alternative conducted emission tests based on the impedance measurements of the EUT, supply and used cables. We also established the correlation, on the basis of impedance measurements, between these alternative conducted emission test method and the reference conducted emission test method.
dc.format.extent8 p.
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Antenes i agrupacions d'antenes
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectromagnetic interference
dc.subject.lcshImpedance (Electricity)
dc.titleAlternative conducted emission measurements on mains without LISNs
dc.subject.lemacInterferència electromagnètica
dc.subject.lemacImpedància (Electricitat)
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.rights.accessOpen Access
dc.description.versionPostprint (author's final draft)
local.citation.authorPous, M.; Silva, F.
local.citation.publicationNameIEEE Electromagnetic Compatibility Magazine

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