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dc.contributor.authorKuball, M.
dc.contributor.authorSerrano Gutiérrez, Jorge
dc.contributor.authorBosak, A.
dc.contributor.authorKrisch, M.
dc.contributor.authorManjon, F. J.
dc.contributor.authorRomero, A.H.
dc.contributor.authorGarro, N.
dc.contributor.authorWang, Xuan
dc.contributor.authorYoshikawa, A.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Física Aplicada
dc.date.accessioned2011-07-28T10:54:10Z
dc.date.available2011-07-28T10:54:10Z
dc.date.created2011-05-19
dc.date.issued2011-05-19
dc.identifier.citationSerrano, J. [et al.]. InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering. "Physical review letters", 19 Maig 2011, vol. 106, núm. 20, p. 1-4.
dc.identifier.issn0031-9007
dc.identifier.urihttp://hdl.handle.net/2117/13072
dc.description.abstractAchieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides
dc.format.extent4 p.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Matemàtiques i estadística::Matemàtica discreta::Combinatòria
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshLattice dynamics
dc.subject.lcshSpectroscopic techniques
dc.titleInN thin film lattice dynamics by grazing incidence inelastic x-ray scattering
dc.typeArticle
dc.subject.lemacDinàmica reticular
dc.subject.lemacReticles, Teoria de
dc.contributor.groupUniversitat Politècnica de Catalunya. GCM - Grup de Caracterització de Materials
dc.identifier.doi10.1103/PhysRevLett.106.205501
dc.relation.publisherversionhttp://prl.aps.org/abstract/PRL/v106/i20/e205501
dc.rights.accessOpen Access
drac.iddocument5832717
dc.description.versionPostprint (published version)
upcommons.citation.authorSerrano, J.; Bosak, A.; Krisch, M.; Manjon, F.; Romero, A.; Garro, N.; Wang, X.; Yoshikawa, A.; Kuball, M.
upcommons.citation.publishedtrue
upcommons.citation.publicationNamePhysical review letters
upcommons.citation.volume106
upcommons.citation.number20
upcommons.citation.startingPage1
upcommons.citation.endingPage4


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