Show simple item record

dc.contributor.authorRosell Gratacòs, Jan
dc.contributor.authorCruz Llopis, Luis Javier de la
dc.contributor.authorPérez, Alexander
dc.contributor.authorSuárez Feijóo, Raúl
dc.contributor.otherUniversitat Politècnica de Catalunya. Institut d'Organització i Control de Sistemes Industrials
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria de Sistemes, Automàtica i Informàtica Industrial
dc.identifier.citationRosell, J. [et al.]. Importance Sampling based on Adaptive Principal Component Analysis. A: IEEE International Symposium on Assembly and Manufacturing. "2011 IEEE International Symposium on Assembly and Manufacturing". Tampere: IEEE, 2011.
dc.description.abstractSampling-based approaches are currently the most efficient ones to solve path planning problems, being their performance dependant on the ability to generate samples in those areas of the configuration space relevant to the problem. This paper introduces a novel importance sampling method that uses Principal Component Analysis to focalize the region where to sample in order to increase the probability of finding collision-free configurations. The proposal is illustrated with a 2D configuration space with a narrow passage and compared to the uniform random sampling method.
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.subjectÀrees temàtiques de la UPC::Informàtica::Robòtica
dc.titleImportance Sampling based on Adaptive Principal Component Analysis
dc.typeConference report
dc.contributor.groupUniversitat Politècnica de Catalunya. SIR - Service and Industrial Robotics
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
dc.description.versionPostprint (author’s final draft)
upcommons.citation.authorRosell, J.; Cruz, L.; Pérez, A.; Suárez, R.
upcommons.citation.contributorIEEE International Symposium on Assembly and Manufacturing
upcommons.citation.publicationName2011 IEEE International Symposium on Assembly and Manufacturing

Files in this item


This item appears in the following Collection(s)

Show simple item record

Except where otherwise noted, content on this work is licensed under a Creative Commons license: Attribution-NonCommercial-NoDerivs 3.0 Spain