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dc.contributor.authorRosell Gratacòs, Jan
dc.contributor.authorCruz Llopis, Luis Javier de la
dc.contributor.authorPérez, Alexander
dc.contributor.authorSuárez Feijóo, Raúl
dc.contributor.otherUniversitat Politècnica de Catalunya. Institut d'Organització i Control de Sistemes Industrials
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria de Sistemes, Automàtica i Informàtica Industrial
dc.date.accessioned2011-06-15T17:11:39Z
dc.date.available2015-03-05T09:50:25Z
dc.date.created2011
dc.date.issued2011
dc.identifier.citationRosell, J. [et al.]. Importance Sampling based on Adaptive Principal Component Analysis. A: IEEE International Symposium on Assembly and Manufacturing. "2011 IEEE International Symposium on Assembly and Manufacturing". Tampere: IEEE, 2011.
dc.identifier.isbn978-1-61284-341-4
dc.identifier.urihttp://hdl.handle.net/2117/12782
dc.description.abstractSampling-based approaches are currently the most efficient ones to solve path planning problems, being their performance dependant on the ability to generate samples in those areas of the configuration space relevant to the problem. This paper introduces a novel importance sampling method that uses Principal Component Analysis to focalize the region where to sample in order to increase the probability of finding collision-free configurations. The proposal is illustrated with a 2D configuration space with a narrow passage and compared to the uniform random sampling method.
dc.language.isoeng
dc.publisherIEEE
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Informàtica::Robòtica
dc.subject.lcshInformatica
dc.titleImportance Sampling based on Adaptive Principal Component Analysis
dc.typeConference report
dc.subject.lemacRobòtica
dc.contributor.groupUniversitat Politècnica de Catalunya. SIR - Service and Industrial Robotics
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
local.identifier.drac5779685
dc.description.versionPostprint (author’s final draft)
local.citation.authorRosell, J.; Cruz, L.; Pérez, A.; Suárez, R.
local.citation.contributorIEEE International Symposium on Assembly and Manufacturing
local.citation.pubplaceTampere
local.citation.publicationName2011 IEEE International Symposium on Assembly and Manufacturing


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