| dc.contributor.author | Kral, Z |
| dc.contributor.author | Ferré Burrull, José |
| dc.contributor.author | Todorov Trifonov, Trifon |
| dc.contributor.author | Marsal, Lf |
| dc.contributor.author | Rodríguez Martínez, Ángel |
| dc.contributor.author | Pallares, J |
| dc.contributor.author | Alcubilla González, Ramón |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
| dc.date.accessioned | 2018-09-21T18:32:17Z |
| dc.date.issued | 2008-09-30 |
| dc.identifier.citation | Kral, Z., Ferré-Borrull, J, Trifonov, T., Marsal, L., Rodriguez, A., Pallares, J., Alcubilla, R. Mid-IR characterization of photonic bands in 2D photonic crystals on silicon. "Thin solid films", 30 Setembre 2008, vol. 516, núm. 22, p. 8059-8063. |
| dc.identifier.issn | 0040-6090 |
| dc.identifier.uri | http://hdl.handle.net/2117/121415 |
| dc.description.abstract | We report the characterization of two-dimensional silicon photonic crystals using angular-dependent reflectivity in the mid-IR. The photonic crystals are obtained by electrochemical etching of an ordered array of holes into silicon. The measurements are compared with the theoretical calculations of the corresponding model based on the interaction of the incident light with the photonic crystal sample. A good agreement between the measurements and the calculations is achieved. |
| dc.format.extent | 5 p. |
| dc.language.iso | eng |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 Spain |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Telecomunicació òptica::Fotònica |
| dc.subject.lcsh | Photonics |
| dc.subject.other | Infra-red spectroscopy |
| dc.subject.other | Photonic bands |
| dc.subject.other | Macroporous silicon |
| dc.subject.other | Photonic crystals |
| dc.title | Mid-IR characterization of photonic bands in 2D photonic crystals on silicon |
| dc.type | Article |
| dc.subject.lemac | Fotònica |
| dc.contributor.group | Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
| dc.identifier.doi | 10.1016/j.tsf.2008.04.013 |
| dc.description.peerreviewed | Peer Reviewed |
| dc.relation.publisherversion | https://www.sciencedirect.com/science/article/pii/S0040609008003738?via%3Dihub |
| dc.rights.access | Restricted access - publisher's policy |
| local.identifier.drac | 650528 |
| dc.description.version | Postprint (published version) |
| dc.date.lift | 10000-01-01 |
| local.citation.author | Kral, Z.; Ferré-Borrull, J; Trifonov, T.; Marsal, L.; Rodriguez, A.; Pallares, J.; Alcubilla, R. |
| local.citation.publicationName | Thin solid films |
| local.citation.volume | 516 |
| local.citation.number | 22 |
| local.citation.startingPage | 8059 |
| local.citation.endingPage | 8063 |
