Now showing items 1-8 of 8

    • Alternating direction implicit time integrations for finite difference acoustic wave propagation: parallelization and convergence 

      Otero Calviño, Beatriz; Rojas, Otilio; Moya, Ferrán; Castillo, José (Elsevier, 2020-06-15)
      Article
      Restricted access - publisher's policy
      This work studies the parallelization and empirical convergence of two finite difference acoustic wave propagation methods on 2-D rectangular grids, that use the same alternating direction implicit (ADI) time integration. ...
    • On the use of probabilistic worst-case execution time estimation for parallel applications in high performance systems 

      Fusi, Matteo; Mazzocchetti, Fabio; Farres, Albert; Kosmidis, Leonidas; Canal Corretger, Ramon; Cazorla Almeida, Francisco Javier; Abella Ferrer, Jaume (Multidisciplinary Digital Publishing Institute (MDPI), 2020-03-01)
      Article
      Open Access
      Some high performance computing (HPC) applications exhibit increasing real-time requirements, which call for effective means to predict their high execution times distribution. This is a new challenge for HPC applications ...
    • Distributed training of deep neural networks with spark: The MareNostrum experience 

      Cruz, Leonel; Tous Liesa, Rubén; Otero Calviño, Beatriz (Elsevier, 2019-07-01)
      Article
      Restricted access - publisher's policy
      Deployment of a distributed deep learning technology stack on a large parallel system is a very complex process, involving the integration and configuration of several layers of both, general-purpose and custom software. ...
    • Artificial neural networks as emerging tools for earthquake detection 

      Rojas, Otilio; Otero Calviño, Beatriz; Alvarado, Leonardo; Mus, Sergi; Tous Liesa, Rubén (2019)
      Article
      Open Access
      As seismic networks continue to spread and monitoring sensors become more ef¿cient, the abundance of data highly surpasses the processing capabilities of earthquake interpretation analysts. Earthquake catalogs are fundamental ...
    • SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems 

      Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanansios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal Corretger, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano; Anglada Sanchez , Martí; González Colás, Antonio María; Mariani, R. (Institute of Electrical and Electronics Engineers (IEEE), 2018-01-01)
      Article
      Open Access
      Cross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different ...
    • Optimization of FinFET-based gain cells for low power sub-vt embedded drams 

      Amat, Esteve; Calomarde Palomino, Antonio; Canal Corretger, Ramon; Rubio Sola, Jose Antonio (2018-06-01)
      Article
      Open Access
      Sub-threshold circuits (sub-V T) are a promising alternative in the implementation of low power electronics. The implementation of gain-cell embedded DRAMs (eDRAMs) based on FinFET devices requires a careful design to ...
    • Replacing 6T SRAMs with 3T1D DRAMs in the L1 data cache to combat process variability 

      Liang, Xiaoyao; Canal Corretger, Ramon; Wei, Gu-Yeon (2008-02)
      Article
      Open Access
      With continued technology scaling, process variations will be especially detrimental to six-transistor static memory structures (6T SRAMs). A memory architecture using three-transistor, one-diode DRAM (3T1D) cells in the ...
    • Review on suitable eDRAM configurations for next nano-metric electronics era 

      Amat, Esteve; Canal Corretger, Ramon; Calomarde Palomino, Antonio; Rubio Sola, Jose Antonio (2018-03)
      Article
      Open Access
      We summarize most of our studies focused on the main reliability issues that can threat the gain-cells eDRAM behavior when it is simulated at the nano-metric device range has been collected in this review. So, to outperform ...