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Artificial neural networks as emerging tools for earthquake detection
(2019)
Article
Open AccessAs seismic networks continue to spread and monitoring sensors become more ef¿cient, the abundance of data highly surpasses the processing capabilities of earthquake interpretation analysts. Earthquake catalogs are fundamental ... -
SyRA: early system reliability analysis for cross-layer soft errors resilience in memory arrays of microprocessor systems
(Institute of Electrical and Electronics Engineers (IEEE), 2018-01-01)
Article
Open AccessCross-layer reliability is becoming the preferred solution when reliability is a concern in the design of a microprocessor-based system. Nevertheless, deciding how to distribute the error management across the different ... -
Optimization of FinFET-based gain cells for low power sub-vt embedded drams
(2018-06-01)
Article
Open AccessSub-threshold circuits (sub-V T) are a promising alternative in the implementation of low power electronics. The implementation of gain-cell embedded DRAMs (eDRAMs) based on FinFET devices requires a careful design to ... -
Replacing 6T SRAMs with 3T1D DRAMs in the L1 data cache to combat process variability
(2008-02)
Article
Open AccessWith continued technology scaling, process variations will be especially detrimental to six-transistor static memory structures (6T SRAMs). A memory architecture using three-transistor, one-diode DRAM (3T1D) cells in the ... -
Review on suitable eDRAM configurations for next nano-metric electronics era
(2018-03)
Article
Open AccessWe summarize most of our studies focused on the main reliability issues that can threat the gain-cells eDRAM behavior when it is simulated at the nano-metric device range has been collected in this review. So, to outperform ...
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