Statistical analysis of SRAM aarametric failure under supply voltage scaling
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Document typeConference report
Defense date2010
PublisherIEEE Computer Society Publications
Rights accessRestricted access - publisher's policy
CitationVatajelu, E.; Figueras, J. Statistical analysis of SRAM aarametric failure under supply voltage scaling. A: IEEE-TTTC International Conference on Automation, Quality and Testing, Robotics. "IEEE Automation, Quality and Testing, Robotics - AQTR 2010, Cl". Cluj Napoca: IEEE Computer Society Publications, 2010, p. 1-6.
Publisher versionhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5520825
Collections
- QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat - Ponències/Comunicacions de congressos [48]
- QINE - Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades - Ponències/Comunicacions de congressos [61]
- Departament d'Enginyeria Electrònica - Ponències/Comunicacions de congressos [1456]
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