Statistical analysis of SRAM aarametric failure under supply voltage scaling

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Vatajelu, Elena Ioana
Figueras Pàmies, Joan
Document typeConference report
Date issued2010
PublisherIEEE Computer Society Publications
Rights accessRestricted access - publisher's policy
CitationVatajelu, E.; Figueras, J. Statistical analysis of SRAM aarametric failure under supply voltage scaling. A: IEEE-TTTC International Conference on Automation, Quality and Testing, Robotics. "IEEE Automation, Quality and Testing, Robotics - AQTR 2010, Cl". Cluj Napoca: IEEE Computer Society Publications, 2010, p. 1-6. 
URIhttp://hdl.handle.net/2117/11965
DOI10.1109/AQTR.2010.5520825
Publisher versionhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5520825
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