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Characterization of 2D macroporous silicon photonic crystals: improving the photonic band identification in angular-dependent reflection spectroscopy in the mid-IR

dc.contributor.authorKrál, Z
dc.contributor.authorFerré Burrull, José
dc.contributor.authorPallarès Marzal, Josep
dc.contributor.authorTodorov Trifonov, Trifon
dc.contributor.authorRodríguez Martínez, Ángel
dc.contributor.authorAlcubilla González, Ramón
dc.contributor.authorMarsal, L F
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2018-06-11T16:49:30Z
dc.date.issued2008-02
dc.identifier.citationKrál, Z., Ferré-Borrull, J, Pallarès, J., Trifonov, T., Rodriguez, A., Alcubilla, R., Marsal, L. Characterization of 2D macroporous silicon photonic crystals: improving the photonic band identification in angular-dependent reflection spectroscopy in the mid-IR. "Materials science and engineering B. Solid state materials for advanced tech", Febrer 2008, vol. 147, núm. 2-3, p. 179-182.
dc.identifier.issn0921-5107
dc.identifier.urihttp://hdl.handle.net/2117/118023
dc.description.abstractWe report the experimental characterization of two-dimensional (2D) macroporous silicon photonic crystals using angular-dependent reflectance spectroscopy in the mid-IR region. We have investigated different sample structures and we have shown that an adequate post-processing of the measured data is crucial in order to recognize the photonic bands and to achieve a good agreement of the measured data with the theoretical predictions for the studied structures.
dc.format.extent4 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Telecomunicació òptica::Fotònica
dc.subject.lcshPhotonic crystals
dc.subject.otherInfrared spectroscopy
dc.subject.otherPhotonic bands
dc.subject.otherMacroporous silicon
dc.subject.otherPhotonic crystals
dc.titleCharacterization of 2D macroporous silicon photonic crystals: improving the photonic band identification in angular-dependent reflection spectroscopy in the mid-IR
dc.typeArticle
dc.subject.lemacCristalls fotònics
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1016/j.mseb.2007.09.082
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://www.sciencedirect.com/science/article/pii/S0921510707005697
dc.rights.accessRestricted access - publisher's policy
local.identifier.drac650437
dc.description.versionPostprint (published version)
dc.date.lift10000-01-01
local.citation.authorKrál, Z.; Ferré-Borrull, J; Pallarès, J.; Trifonov, T.; Rodriguez, A.; Alcubilla, R.; Marsal, L.
local.citation.publicationNameMaterials science and engineering B. Solid state materials for advanced tech
local.citation.volume147
local.citation.number2-3
local.citation.startingPage179
local.citation.endingPage182


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