UPCommons està en procés de migració del dia 10 fins al 14 Juliol. L’autentificació està deshabilitada per evitar canvis durant aquesta migració.
Characterization of a-Si:H/c-Si interfaces by effective-lifetime measurements
View/Open
1.2128047.pdf (261,6Kb) (Restricted access)
Request copy
Què és aquest botó?
Aquest botó permet demanar una còpia d'un document restringit a l'autor. Es mostra quan:
- Disposem del correu electrònic de l'autor
- El document té una mida inferior a 20 Mb
- Es tracta d'un document d'accés restringit per decisió de l'autor o d'un document d'accés restringit per política de l'editorial
Cita com:
hdl:2117/117798
Document typeArticle
Defense date2005-11
PublisherAmerican Institute of Physics (AIP)
Rights accessRestricted access - publisher's policy
All rights reserved. This work is protected by the corresponding intellectual and industrial
property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public
communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
This article studies theoretically and experimentally the recombination at the amorphous/crystalline silicon interface of a heterojunction with intrinsic thin layer (HIT) structure without metallization. We propose a physical model to calculate the interface recombination rate under illumination. This model calculates the effective lifetime teff as a function of the average excess minority carrier concentration¿¿n¿. In order to test the model, we prepared a set of HIT structures. The dependence of teff vs ¿¿n¿ of the samples is measured using the quasi-steady-state photoconductance technique. By fitting our model to the experimental data, we determine the a-Si:H/c-Siinterface parameters and the doping density of the amorphous layer.
CitationGarin, M., Rau, U., Bredle, W., Martin, I., Alcubilla, R. Characterization of a-Si:H/c-Si interfaces by effective-lifetime measurements. "Journal of applied physics", Novembre 2005, vol. 98.
ISSN0021-8979
Files | Description | Size | Format | View |
---|---|---|---|---|
1.2128047.pdf![]() | 261,6Kb | Restricted access |