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dc.contributor.authorCampos García, Antonio
dc.contributor.authorRiera Galindo, Sergi
dc.contributor.authorPuigdollers i González, Joaquim
dc.contributor.authorMas Torrent, Marta
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2018-05-30T12:17:34Z
dc.date.available2019-04-19T00:30:11Z
dc.date.issued2018-04-19
dc.identifier.citationCampos, A., Riera, S., Puigdollers, J., Mas, M. Reduction of charge traps and stability enhancement in solution-processed organic field-effect transistors based on a blended n-type semiconductor. "ACS Applied materials and interfaces", 19 Abril 2018, vol. 10, p. 15952-15961.
dc.identifier.issn1944-8252
dc.identifier.urihttp://hdl.handle.net/2117/117625
dc.descriptionThis document is the unedited Author’s version of a Submitted Work that was subsequently accepted for publication in ACS Applied Materials & Interfaces, copyright © American Chemical Society after peer review. To access the final edited and published work see DOI:10.1021/acsami.8b02851.
dc.description.abstractSolution-processed n-type organic field-effect transistors (OFETs) are essential elements for developing large-area, low-cost, and all organic logic/complementary circuits. Nonetheless, the development of air-stable n-type organic semiconductors (OSCs) lags behind their p-type counterparts. The trapping of electrons at the semiconductor–dielectric interface leads to a lower performance and operational stability. Herein, we report printed small-molecule n-type OFETs based on a blend with a binder polymer, which enhances the device stability due to the improvement of the semiconductor–dielectric interface quality and a self-encapsulation. Both combined effects prevent the fast deterioration of the OSC. Additionally, a complementary metal-oxide semiconductor-like inverter is fabricated depositing p-type and n-type OSCs simultaneously.
dc.format.extent10 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors
dc.subject.lcshTransistors
dc.subject.otherDensity-of-states
dc.subject.otherHigh stability
dc.subject.otherN-type
dc.subject.otherOFET
dc.subject.otherSemiconductor-dielectric interface
dc.titleReduction of charge traps and stability enhancement in solution-processed organic field-effect transistors based on a blended n-type semiconductor
dc.typeArticle
dc.subject.lemacTransistors
dc.contributor.groupUniversitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies
dc.identifier.doi10.1021/acsami.8b02851
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://pubs.acs.org/doi/10.1021/acsami.8b02851
dc.rights.accessOpen Access
local.identifier.drac22955154
dc.description.versionPostprint (published version)
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/FP7/306826/EU/Surface Self-Assembled Molecular Electronic Devices: Logic Gates, Memories and Sensors/E-GAMES
local.citation.authorCampos, A.; Riera, S.; Puigdollers, J.; Mas, M.
local.citation.publicationNameACS Applied materials and interfaces
local.citation.volume10
local.citation.startingPage15952
local.citation.endingPage15961


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