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dc.contributor.authorVidas, Luciana
dc.contributor.authorGünther, Christian M.
dc.contributor.authorMiller, Timothy A.
dc.contributor.authorPfau, Bastian
dc.contributor.authorPerez-Salinas, Daniel
dc.contributor.authorMartínez, Elías
dc.contributor.authorSchneider, Michael
dc.contributor.authorGuehers, Erik
dc.contributor.authorGargiani, Pierluigi
dc.contributor.authorValvidares, Manuel
dc.contributor.authorMarvel, Robert E.
dc.contributor.authorHallman, Kent A.
dc.contributor.authorHaglund, Richard F.
dc.contributor.authorEisebitt, Stefan
dc.contributor.authorWall, Simon
dc.contributor.otherUniversitat Politècnica de Catalunya. Institut de Ciències de l'Educació
dc.date.accessioned2018-05-23T13:22:21Z
dc.date.available2019-05-16T00:30:32Z
dc.date.issued2018-05-16
dc.identifier.citationVidas, L. [et al.]. Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography. "Nano Letters", 16 Maig 2018.
dc.identifier.urihttp://hdl.handle.net/2117/117423
dc.description.abstractWe use resonant soft X-ray holography to image the insulator−metal phase transition in vanadium dioxide with element and polarization specificity and nanometer spatial resolution. We observe that nanoscale inhomogeneity in the film results in spatial-dependent transition pathways between the insulating and metallic states. Additional nanoscale phases form in the vicinity of defects which are not apparent in the initial or final states of the system, which would be missed in area-integrated X-ray absorption measurements. These intermediate phases are vital to understand the phase transition in VO2, and our results demonstrate how resonant imaging can be used to understand the electronic properties of phase-separated correlated materials obtained by X-ray absorption.
dc.format.extent5 p.
dc.language.isoeng
dc.publisherACS
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Física
dc.subject.lcshHolography
dc.subject.otherholography
dc.titleImaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography
dc.typeArticle
dc.subject.lemacHolografia
dc.identifier.doi10.1021/acs.nanolett.8b00458
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttps://pubs.acs.org/doi/abs/10.1021/acs.nanolett.8b00458?journalCode=nalefd
dc.rights.accessOpen Access
dc.description.versionPostprint (author's final draft)
dc.relation.projectidinfo:eu-repo/grantAgreement/MINECO//SEV-2015-0522/ES/AGR-INSTITUTO DE CIENCIAS FOTONICAS/
dc.relation.projectidCIG12-GA-2013-618487
dc.relation.projectidEECS-1509740
dc.relation.projectidDMR-1207507
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/FP7/618487/EU/Dynamically controlling the properties of complex materials with light/DCCM
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/758461/EU/Probing nanoscale and femtosecond fluctuations in high temperature superconductors/SeeSuper
local.citation.publicationNameNano Letters


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