Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography
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10.1021/acs.nanolett.8b00458
Inclou dades d'ús des de 2022
Cita com:
hdl:2117/117423
Tipus de documentArticle
Data publicació2018-05-16
EditorACS
Condicions d'accésAccés obert
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Reconeixement-NoComercial-SenseObraDerivada 3.0 Espanya
ProjecteAGR-INSTITUTO DE CIENCIAS FOTONICAS (MINECO-SEV-2015-0522)
DCCM - Dynamically controlling the properties of complex materials with light (EC-FP7-618487)
SeeSuper - Probing nanoscale and femtosecond fluctuations in high temperature superconductors (EC-H2020-758461)
DCCM - Dynamically controlling the properties of complex materials with light (EC-FP7-618487)
SeeSuper - Probing nanoscale and femtosecond fluctuations in high temperature superconductors (EC-H2020-758461)
Abstract
We use resonant soft X-ray holography to image the insulator−metal phase transition in vanadium dioxide with element and polarization specificity and nanometer spatial resolution. We observe that nanoscale inhomogeneity in the film results in spatial-dependent transition pathways between the insulating and metallic states. Additional nanoscale phases form in the vicinity of defects which are not apparent in the initial or final states of the system, which would be missed in area-integrated X-ray absorption measurements. These intermediate phases are vital to understand the phase transition in VO2, and our results demonstrate how resonant imaging can be used to understand the electronic properties of phase-separated correlated materials obtained by X-ray absorption.
CitacióVidas, L. [et al.]. Imaging Nanometer Phase Coexistence at Defects During the Insulator−Metal Phase Transformation in VO2 Thin Films by Resonant Soft X‑ray Holography. "Nano Letters", 16 Maig 2018.
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