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Robust extreme value estimation for full time-domain EMI measurements

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10.1109/EMCEurope.2017.8094729
 
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hdl:2117/116880

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Azpúrua Auyanet, Marco AurelioMés informacióMés informacióMés informació
Pous Solà, MarcMés informacióMés informació
Silva Martínez, FernandoMés informacióMés informacióMés informació
Document typeConference report
Defense date2017
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
A robust approach for estimating the expected maximum levels of radiofrequency electromagnetic emissions is proposed. The expected maximum peak value is intended to provide a statistical approximation for the worst case emissions scenario that accounts for the variability of the measured interference. The estimates are obtained through Monte Carlo resampling from a non-parametric distribution fitted by means of kernel density estimation applied to the time-frequency representation of the assessed interference. As a key advantage, calculating the expected maximum peak value does not require increasing the dwell time or holding the maximum value over successive sweeps. Results indicate the methodology is better suited than previous approaches for calculating the expected maximum peak value because it does not depend on normality assumptions difficult to guarantee in practice. The proposed technique is an example of how full time-domain EMI measurements can be exploited for obtaining further insights.
CitationAzpurua, M. A., Pous, M., Silva, F. Robust extreme value estimation for full time-domain EMI measurements. A: European Symposium on Electromagnetic Compatibility. "2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE: Eseo-Angers, France: 4-7 Sept. 2017". Institute of Electrical and Electronics Engineers (IEEE), 2017, p. 1-6. 
URIhttp://hdl.handle.net/2117/116880
DOI10.1109/EMCEurope.2017.8094729
ISBN978-1-5386-0689-6
Publisher versionhttps://ieeexplore.ieee.org/document/8094729/
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