Show simple item record

dc.contributor.authorBalasch, Josep
dc.contributor.authorArumi Delgado, Daniel
dc.contributor.authorManich Bou, Salvador
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2018-04-25T16:56:17Z
dc.date.available2018-04-25T16:56:17Z
dc.date.issued2018
dc.identifier.citationBalasch, J., Arumi, D., Manich, S. Design and validation of a platform for electromagnetic fault injection. A: Conference on Design of Circuits and Integrated Systems. "Design of Circuits and Integrated Systems (DCIS), 2017 32nd Conference on". Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1-6.
dc.identifier.isbn978-1-5386-5108-7
dc.identifier.urihttp://hdl.handle.net/2117/116688
dc.description.abstractSecurity is acknowledged as one of the main challenges in the design and deployment of embedded circuits. Devices need to operate on-the-field safely and correctly, even when at physical reach of potential adversaries. One of the most powerful techniques to compromise the correct functioning of a device are fault injection attacks. They enable an active adversary to trigger errors on a circuit in order to bypass security features or to gain knowledge of security-sensitive information. There are several methods to induce such errors. In this work we focus on the injection of faults through the electromagnetic (EM) channel. In particular, we document our efforts towards building a suitable platform for EM pulse injection. We design a pulse injection circuit that can provide currents over 20 A to an EM injector in order to generate abrupt variations of the EM field on the vicinity of a circuit. We validate the suitability of our platform by applying a well-know attack on an embedded 8-bit microcontroller implementing the AES block cipher. In particular, we show how to extract the AES secret cryptographic keys stored in the device by careful injection of faults during the encryption operations and simple analysis of the erroneous outputs.
dc.format.extent6 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshIntegrated circuits
dc.subject.lcshElectromagnetic interference
dc.subject.otherElectromagnetic interference
dc.subject.otherCircuit faults
dc.subject.otherProbes
dc.subject.otherSecurity
dc.subject.otherElectromagnetics
dc.subject.otherPulse generation
dc.subject.otherCapacitors
dc.titleDesign and validation of a platform for electromagnetic fault injection
dc.typeConference report
dc.subject.lemacCircuits integrats
dc.subject.lemacInterferència electromagnètica
dc.contributor.groupUniversitat Politècnica de Catalunya. QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat
dc.identifier.doi10.1109/DCIS.2017.8311630
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/document/8311630/
dc.rights.accessOpen Access
local.identifier.drac22317459
dc.description.versionPostprint (published version)
dc.relation.projectidinfo:eu-repo/grantAgreement/EC/H2020/695305/EU/Post-Snowden Circuits and Design Methods for Security/Cathedral
local.citation.authorBalasch, J.; Arumi, D.; Manich, S.
local.citation.contributorConference on Design of Circuits and Integrated Systems
local.citation.publicationNameDesign of Circuits and Integrated Systems (DCIS), 2017 32nd Conference on
local.citation.startingPage1
local.citation.endingPage6


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record