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Fabrication and characterization of in-situ doped a-Si0.8C0.2 emitter bipolar transistors
dc.contributor.author | Orpella García, Alberto |
dc.contributor.author | Puigdollers i González, Joaquim |
dc.contributor.author | Bardés Llorensí, Daniel |
dc.contributor.author | Alcubilla González, Ramón |
dc.contributor.author | Marsal, L F |
dc.contributor.author | Pallarès Marzal, Josep |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2017-12-22T17:21:35Z |
dc.date.issued | 2000-09 |
dc.identifier.citation | Orpella, A., Puigdollers, J., Bardes, D., Alcubilla, R., Marsal, L., Pallarès, J. Fabrication and characterization of in-situ doped a-Si0.8C0.2 emitter bipolar transistors. "Solid-state electronics", Setembre 2000, vol. 44, núm. 9, p. 1543-1548. |
dc.identifier.issn | 0038-1101 |
dc.identifier.uri | http://hdl.handle.net/2117/112407 |
dc.description.abstract | Silicon–carbon emitters were deposited by plasma enhanced chemical vapour deposition (PECVD) on a conventional silicon transistor base. The resulting transistors were annealed after the emitter had been deposited which led to the dopant diffusing from the amorphous layer into the crystalline base. This paper analyses the effect of the annealing temperature on the properties of the amorphous layer and on the electrical characteristics of the transistors. First, after isochronal annealing between 740°C and 880°C, the physical properties of PECVD a-Si0.8C0.2:H(n) layers were measured. Then, the base current of the transistors was analysed as a function of the annealing temperature to gain deeper insight into its physical origin. |
dc.format.extent | 6 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica::Components electrònics::Transistors |
dc.subject | Àrees temàtiques de la UPC::Física::Física de l'estat sòlid |
dc.subject.lcsh | Bipolar transistors |
dc.subject.lcsh | Silicon |
dc.subject.other | Bipolar transistors |
dc.subject.other | Annealed amorphous silicon–carbon |
dc.title | Fabrication and characterization of in-situ doped a-Si0.8C0.2 emitter bipolar transistors |
dc.type | Article |
dc.subject.lemac | Transistors bipolars |
dc.subject.lemac | Silici |
dc.contributor.group | Universitat Politècnica de Catalunya. MNT - Grup de Recerca en Micro i Nanotecnologies |
dc.identifier.doi | 10.1016/S0038-1101(00)00121-0 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | https://www.sciencedirect.com/science/article/pii/S0038110100001210 |
dc.rights.access | Restricted access - publisher's policy |
local.identifier.drac | 763409 |
dc.description.version | Postprint (published version) |
dc.date.lift | 10000-01-01 |
local.citation.author | Orpella, A.; Puigdollers, J.; Bardes, D.; Alcubilla, R.; Marsal, L.; Pallarès, J. |
local.citation.publicationName | Solid-state electronics |
local.citation.volume | 44 |
local.citation.number | 9 |
local.citation.startingPage | 1543 |
local.citation.endingPage | 1548 |
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