| dc.contributor.author | Maya Sánchez, Mª del Carmen |
| dc.contributor.author | Lázaro Guillén, Antoni |
| dc.contributor.author | Pradell i Cara, Lluís |
| dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
| dc.date.accessioned | 2007-07-02T10:32:32Z |
| dc.date.available | 2007-07-02T10:32:32Z |
| dc.date.created | 2003 |
| dc.date.issued | 2003-07-31 |
| dc.identifier.citation | Maya, M. C.; Lázaro, A.; Pradell, L. Extraction of an avalanche diode noise model for its application as on-wafer noise source. Microwave and optical technology letters, 2003, vol. 38, núm. 2, p. 89-92. |
| dc.identifier.issn | 0895-2477 |
| dc.identifier.uri | http://hdl.handle.net/2117/1120 |
| dc.description.abstract | This paper presents a method to characterize the excess noise ratio (ENR) of an unmatched avalanche noise diode for application as an on-wafer noise source. It is based on the determination of a broadband device noise circuit-model from its measured reflection coefficient and noise powers. Measured ENR is used to calibrated a noise receiver up to 40 GHz. |
| dc.format.extent | 89-92 |
| dc.language.iso | eng |
| dc.publisher | JOHN WILEY & SONS INC |
| dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques |
| dc.subject.lcsh | Electromagnetic noise |
| dc.subject.lcsh | Microwaves |
| dc.subject.lcsh | Diodes, Avalanche |
| dc.subject.other | on-wafer noise source |
| dc.subject.other | excess noise ratio |
| dc.subject.other | small-signal model |
| dc.subject.other | noise temperature measurement |
| dc.subject.other | noise parameters |
| dc.subject.other | avalanche diodes |
| dc.subject.other | electric noise measurement |
| dc.subject.other | electron device noise |
| dc.subject.other | semiconductor device models |
| dc.subject.other | avalanche diode noise model |
| dc.subject.other | unmatched avalanche noise diode |
| dc.subject.other | broadband device noise circuit-model |
| dc.subject.other | reflection coefficient |
| dc.subject.other | noise power |
| dc.subject.other | 0 to 40 GHz |
| dc.title | Extraction of an avalanche diode noise model for its application as on-wafer noise source |
| dc.type | Article |
| dc.subject.lemac | Soroll electromagnètic |
| dc.subject.lemac | Microones |
| dc.subject.lemac | Díodes |
| dc.contributor.group | Universitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones |
| dc.description.peerreviewed | Peer Reviewed |
| dc.rights.access | Open Access |
| local.personalitzacitacio | true |
