An on-line test strategy and analysis for a 1T1R crossbar memory
Document typeConference report
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Rights accessOpen Access
Memristors are emerging devices known by their nonvolability, compatibility with CMOS processes and high density in circuits density in circuits mostly owing to the crossbar nanoarchitecture. One of their most notable applications is in the memory system field. Despite their promising characteristics and the advancements in this emerging technology, variability and reliability are still principal issues for memristors. For these reasons, exploring techniques that check the integrity of circuits is of primary importance. Therefore, this paper proposes a method to perform an on-line test capable to detect a single failure inside the memory crossbar array.
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CitationEscudero, M., Moll, F., Rubio, A., Vourkas, I. An on-line test strategy and analysis for a 1T1R crossbar memory. A: IEEE International Symposium on On-Line Testing and Robust System Design. "2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS 2017): Thessaloniki, Greece: 3-5 July 2017". Thessaloniki: Institute of Electrical and Electronics Engineers (IEEE), 2017, p. 120-125.