Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model
Document typeArticle
Defense date2003-11-30
PublisherJOHN WILEY & SONS INC
Rights accessOpen Access
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Abstract
CitationLázaro, A.; Maya, M. C.; Pradell, L. Bias-dependence of FET intrinsic noise sources, determined with a quasi-2D model. Microwave and optical technology letters, 2003, vol. 39, núm. 4, p. 317-319.
ISSN0895-2477
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