Show simple item record

dc.contributor.authorJauregui Tellería, Ricardo
dc.contributor.authorRiu Costa, Pere Joan
dc.contributor.authorSilva Martínez, Fernando
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2011-01-13T10:36:18Z
dc.date.available2011-01-13T10:36:18Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationJauregui, R.; Riu, P.; Silva, F. Transient FDTD simulation validation. A: International Symposium on Electromagnetic Compatibility. "IEEE International Symposium on Electromagnetic Compatibility". Fort Lauderdale: 2010, p. 1-6.
dc.identifier.isbn978-1-4244-6307-7
dc.identifier.urihttp://hdl.handle.net/2117/11000
dc.description.abstractIn computational electromagnetic simulations, most validation methods have been developed until now to be used in the frequency domain. However, the EMC analysis of the systems in the frequency domain many times is not enough to evaluate the immunity of current communication devices. Based on several studies, in this paper we propose an alternative method of validation of the transients in time domain allowing a rapid and objective quantification of the simulations results.
dc.format.extent6 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshElectromagnetic compatibility
dc.subject.lcshFinite differences
dc.subject.lcshTransients (Electricity)--Electromechanical analogies
dc.subject.lcshElectronic engineering
dc.titleTransient FDTD simulation validation
dc.typeConference report
dc.subject.lemacTransistors
dc.subject.lemacEnginyeria electrònica
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.rights.accessOpen Access
drac.iddocument3336243
dc.description.versionPostprint (published version)
upcommons.citation.authorJauregui, R.; Riu, P.; Silva, F.
upcommons.citation.contributorInternational Symposium on Electromagnetic Compatibility
upcommons.citation.pubplaceFort Lauderdale
upcommons.citation.publishedtrue
upcommons.citation.publicationNameIEEE International Symposium on Electromagnetic Compatibility
upcommons.citation.startingPage1
upcommons.citation.endingPage6


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record

All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder