Mostra el registre d'ítem simple
Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect
dc.contributor.author | Perpiñà, Xavier |
dc.contributor.author | Altet Sanahujes, Josep |
dc.contributor.author | Jordà, Xavier |
dc.contributor.author | Vellvehi, Miquel |
dc.contributor.author | Mestres, Narcís |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2011-01-11T11:22:04Z |
dc.date.available | 2011-01-11T11:22:04Z |
dc.date.created | 2010 |
dc.date.issued | 2010 |
dc.identifier.citation | Perpiñà, X. [et al.]. Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect. "Optics Letters", 2010, vol. 35, núm. 15, p. 2657-2659. |
dc.identifier.issn | 0146-9592 |
dc.identifier.uri | http://hdl.handle.net/2117/10951 |
dc.description.abstract | This Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is based on sensing the phase lag between the power periodically dissipated by a device integrated in an IC (hot spot) and its corresponding thermal gradient into the chip substrate by monitoring the heat-induced refractive index gradient with a laser beam. The experimental results show a high accuracy and prove the suitability of this technique to locate and characterize devices behaving as hot spots in current IC technologies. |
dc.format.extent | 3 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | System-on-chip design and technologies |
dc.subject.lcsh | Electronic engineering |
dc.subject.lcsh | Integrated circuits |
dc.subject.lcsh | Metal oxide semiconductor field-effect transistors |
dc.title | Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect |
dc.type | Article |
dc.subject.lemac | Transistors |
dc.subject.lemac | Electrònica |
dc.contributor.group | Universitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions |
dc.identifier.doi | 10.1364/OL.35.002657 |
dc.relation.publisherversion | http://www.opticsinfobase.org/abstract.cfm?uri=ol-35-15-2657 |
dc.rights.access | Open Access |
local.identifier.drac | 2749821 |
dc.description.version | Postprint (published version) |
local.citation.author | Perpiñà, X.; Altet, J.; Jordà, X.; Vellvehi, M.; Mestres, N. |
local.citation.publicationName | Optics Letters |
local.citation.volume | 35 |
local.citation.number | 15 |
local.citation.startingPage | 2657 |
local.citation.endingPage | 2659 |
Fitxers d'aquest items
Aquest ítem apareix a les col·leccions següents
-
Articles de revista [92]
-
Articles de revista [1.727]