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dc.contributor.authorPurroy Martín, Francesc
dc.contributor.authorPradell i Cara, Lluís
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2007-06-12T15:10:20Z
dc.date.available2007-06-12T15:10:20Z
dc.date.created1997
dc.date.issued2001-10-31
dc.identifier.citationPurroy, F; Pradell, L. New theoretical analysis of the LRRM calibration technique for vector network analyzers. IEEE Transactions on instrumentation and measurement, 2001, vol.50, núm.5, p.1307-1314
dc.identifier.issn0018-9456
dc.identifier.urihttp://hdl.handle.net/2117/1082
dc.description.abstractIn this paper, a new theoretical analysis of the four-standards line-reflect-reflect-match (LRRM) vector network-analyzer (VNA) calibration technique is presented. As a result, it is shown that the reference-impedance (to which the LRRM calibration is referred) cannot generally be defined whenever nonideal standards are used. Based on this consideration, a new algorithm to determine the on-wafer match standard is proposed that improves the LRRM calibration accuracy. Experimental verification of the new theory and algorithm using on-wafer calibrations up to 40 GHz is given.
dc.format.extent1307-1314
dc.language.isoeng
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subject.lcshMicrowave measurements
dc.subject.lcshImpedance matching
dc.subject.lcshCalibration
dc.subject.othercalibration
dc.subject.otherimpedance matching
dc.subject.othermeasurement errors
dc.subject.othermeasurement standards
dc.subject.othermicrowave reflectometry
dc.subject.othernetwork analysers
dc.subject.other40 GHz
dc.subject.othercalibration accuracy
dc.subject.othercalibration algorithm
dc.subject.othererror model
dc.subject.otherfour-standards
dc.subject.otherline-reflect-reflect-match calibration
dc.subject.otheron-wafer calibrations
dc.subject.otheron-wafer match standard
dc.subject.otherreference impedance
dc.subject.otherreference-impedance
dc.subject.otherreflection coefficient magnitude
dc.subject.otherself-calibration
dc.subject.othersystematic errors
dc.subject.othervector network-analyzer calibration
dc.titleNew Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers
dc.typeArticle
dc.subject.lemacMicroones -- Mesurament -- Processament de dades
dc.subject.lemacImpedància (Electricitat)
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access


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