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dc.contributor.authorPerpiñà, Xavier
dc.contributor.authorAltet Sanahujes, Josep
dc.contributor.authorJordà, Xavier
dc.contributor.authorVellvehi, Miquel
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2010-12-10T12:50:59Z
dc.date.available2010-12-10T12:50:59Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationPerpiñà, X. [et al.]. Hot spot detection in integrated circuits laterally accessing to their substrate using a laser beam. A: 16th International workshop on Thermal investigations of ICs and Systems. "16th THERMINIC". Barcelona: IEEE Computer Society Publications, 2010, p. 117-121.
dc.identifier.isbn978-2-35500-012-6
dc.identifier.urihttp://hdl.handle.net/2117/10529
dc.description.abstractIn this paper we present an electro-thermal coupling simulation technique for RF circuits. The proposed methodology takes advantage of well established tools for frequency translating circuits in order to significantly reduce the computational resources needed when frequencies of interest are separated by orders of magnitude.
dc.format.extent5 p.
dc.language.isoeng
dc.publisherIEEE Computer Society Publications
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshSystem-on-chip design and technologies
dc.subject.lcshElectronic engineering
dc.subject.lcshRadio frequency
dc.subject.lcshMetal oxide semiconductors, Complementary
dc.titleHot spot detection in integrated circuits laterally accessing to their substrate using a laser beam
dc.typeConference report
dc.subject.lemacElectrònica
dc.subject.lemacRàdio -- Freqüència modulada
dc.contributor.groupUniversitat Politècnica de Catalunya. HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
dc.rights.accessOpen Access
local.identifier.drac4449049
dc.description.versionPostprint (published version)
local.citation.authorPerpiñà, X.; Altet, J.; Jordà, X.; Vellvehi, M.
local.citation.contributor16th International workshop on Thermal investigations of ICs and Systems
local.citation.pubplaceBarcelona
local.citation.publicationName16th THERMINIC
local.citation.startingPage117
local.citation.endingPage121


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