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dc.contributor.authorOchoa Guerrero, Diego A.
dc.contributor.authorLevit Valenzuela, Rafael
dc.contributor.authorFancher, Christopher M.
dc.contributor.authorEsteves, Giovanni
dc.contributor.authorJones, Jacob L.
dc.contributor.authorGarcía García, José Eduardo
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Física
dc.date.accessioned2017-05-02T17:40:03Z
dc.date.available2018-04-27T00:30:24Z
dc.date.issued2017-04-26
dc.identifier.citationOchoa, D. A., Levit, R., Fancher, C.M., Esteves, G., Jones, J.L., Garcia, J. E. Low temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction. "Journal of Physics D: Applied Physics", 26 Abril 2017, vol. 50, núm. 20, p. 205305-1-205305-14.
dc.identifier.issn1361-6463
dc.identifier.urihttp://hdl.handle.net/2117/103927
dc.description.abstractOrdinary ferroelectrics exhibit a second order phase transition that is characterized by a sharp peak in the dielectric permittivity at a frequency-independent temperature. Furthermore, these materials show a low temperature dielectric relaxation that appears to be a common behavior of perovskite systems. Tetragonal lead zirconate titanate is used here as a model system in order to explore the origin of such an anomaly, since there is no consensus about the physical phenomenon involved in it. Crystallographic and domain structure studies are performed from temperature dependent synchrotron x-ray diffraction measurement. Results indicate that the dielectric relaxation cannot be associated with crystallographic or domain configuration changes. The relaxation process is then parameterized by using the Vogel–Fulcher–Tammann phenomenological equation. Results allow us to hypothesize that the observed phenomenon is due to changes in the dynamic behavior of the ferroelectric domains related to the fluctuation of the local polarization.
dc.language.isoeng
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 Spain
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Física
dc.subject.lcshFerroelectric crystals
dc.subject.lcshPiezoelectric materials
dc.subject.lcshDielectric relaxation
dc.subject.otherferroelectrics
dc.subject.otherpiezoelectric materials
dc.subject.otherdielectric response
dc.subject.otherdielectric relaxation
dc.titleLow temperature dielectric relaxation in ordinary perovskite ferroelectrics: enlightenment from high-energy x-ray diffraction
dc.typeArticle
dc.subject.lemacCristalls ferroelectrics
dc.subject.lemacMaterials piezoelèctrics
dc.subject.lemacRelaxació dielèctrica
dc.contributor.groupUniversitat Politècnica de Catalunya. CEMAD - Caracterització Elèctrica de Materials i Dispositius
dc.identifier.doi10.1088/1361-6463/aa6b9e
dc.rights.accessOpen Access
local.identifier.drac20318310
dc.description.versionPostprint (author's final draft)
local.citation.authorOchoa, D. A.; Levit, R.; Fancher, C.M.; Esteves, G.; Jones, J.L.; Garcia, J. E.
local.citation.publicationNameJournal of Physics D: Applied Physics
local.citation.volume50
local.citation.number20
local.citation.startingPage205305-1
local.citation.endingPage205305-14


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