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Deconstructing the governing dissipative phenomena in the nanoscale

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hdl:2117/102982

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Santos Hernández, Sergio
Amadei, Carlo Alberto
Tang, Tzu-Chieh
Barcons Xixons, VíctorMés informacióMés informacióMés informació
Chiesa, Matteo
Document typeResearch report
Defense date2014-01
Rights accessOpen Access
All rights reserved. This work is protected by the corresponding intellectual and industrial property rights. Without prejudice to any existing legal exemptions, reproduction, distribution, public communication or transformation of this work are prohibited without permission of the copyright holder
Abstract
An expression describing the controlling parameters involved in short range nanoscale dissipation is proposed and supported by simulations and experimental findings. The expression is deconstructed into the geometrical, dynamic, chemical and mechanical properties of the system. In atomic force microscopy these are translated into 1) tip radius and tip-sample deformation, 2) resonant frequency and oscillation amplitude and 3) hysteretic and viscous dissipation. The latter are characteristic parameters defining the chemical and mechanical properties of the tip-sample system. Long range processes are also discussed and footprints are identified in experiments conducted on mica and silicon samples. The present methodology can be exploited to validate or invalidate nanoscale dissipative models by comparing predictions with experimental observables.
CitationSantos, S., Amadei, C., Tang, T., Barcons, V., Chiesa, M. "Deconstructing the governing dissipative phenomena in the nanoscale". 2014. 
URIhttp://hdl.handle.net/2117/102982
URL other repositoryhttps://arxiv.org/abs/1401.6587
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  • Departament d'Enginyeria Minera, Industrial i TIC - Reports de recerca [62]
  • CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació - Reports de recerca [5]
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