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dc.contributor.authorSantos Hernandez, Sergio
dc.contributor.authorBarcons Xixons, Víctor
dc.contributor.authorFont Teixidó, Josep
dc.contributor.authorThomson, Neil H.
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Minera, Industrial i TIC
dc.date.accessioned2017-03-27T15:56:43Z
dc.date.available2017-03-27T15:56:43Z
dc.date.issued2010-06-21
dc.identifier.citationSantos, S., Barcons, V., Font, J., Thomson, N. Cantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions. "Journal of physics D. Applied physics", 21 Juny 2010, vol. 43, núm. 27, p. 1-7.
dc.identifier.issn0022-3727
dc.identifier.urihttp://hdl.handle.net/2117/102923
dc.description.abstractTransitions between the attractive and the repulsive force regimes for amplitude modulation atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in amplitude and phase, or continuous and smooth. During the transitions, peak repulsive and average forces can be up to an order of magnitude higher when these are discrete. Under certain circumstances, for example, when the tip radius is relatively large (e.g. R > 20–30 nm) and for high cantilever free amplitudes (e.g. A0 > 40–50 nm), the L state can be reached with relatively low set-points only (e.g. Asp/A0 < 0.30). We find that these cases do not generally lead to higher resolution but increase the background noise instead. This is despite the fact that the imaging can be non-contact under these conditions. The appearance of background noise is linked to increasing cantilever mean deflection and tip–surface proximity with increasing free amplitude in the L state. Cantilever dynamics in amplitude modulation AFM: Continuous and discontinuous transitions (PDF Download Available). Available from: https://www.researchgate.net/publication/231025693_Cantilever_dynamics_in_amplitude_modulation_AFM_Continuous_and_discontinuous_transitions [accessed Mar 27, 2017].
dc.format.extent7 p.
dc.language.isoeng
dc.subjectÀrees temàtiques de la UPC::Física
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica
dc.subject.lcshAtomic force microscopy
dc.subject.lcshModulation (Electronics)
dc.subject.lcshAmplitude modulation
dc.titleCantilever dynamics in amplitude modulation AFM: continuous and discontinuous transitions
dc.typeArticle
dc.subject.lemacMicroscòpia de força atòmica
dc.subject.lemacModulació (Electrònica)
dc.contributor.groupUniversitat Politècnica de Catalunya. SEPIC - Sistemes Electrònics de Potència i de Control
dc.identifier.doi10.1088/0022-3727/43/27/275401
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://iopscience.iop.org/0022-3727/43/27/275401/pdf/0022-3727_43_27_275401.pdf
dc.rights.accessOpen Access
drac.iddocument2589004
dc.description.versionPostprint (author's final draft)
upcommons.citation.authorSantos, S., Barcons, V., Font, J., Thomson, N.
upcommons.citation.publishedtrue
upcommons.citation.publicationNameJournal of physics D. Applied physics
upcommons.citation.volume43
upcommons.citation.number27
upcommons.citation.startingPage1
upcommons.citation.endingPage7


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