Transitions between the attractive and the repulsive force regimes for amplitude modulation atomic force microscopy (AFM) can be either discontinuous, with a corresponding jump in amplitude and phase, or continuous and smooth. During the transitions, peak repulsive and average forces can be up to an order of magnitude higher when these are discrete. Under certain circumstances, for example, when the tip radius is relatively large (e.g. R > 20–30 nm) and for high cantilever free amplitudes (e.g. A0 > 40–50 nm), the L state can be reached with relatively low set-points only (e.g. Asp/A0 < 0.30). We find that these cases do not generally lead to higher resolution but increase the background noise instead. This is despite the fact that the imaging can be non-contact under these conditions. The appearance of background noise is linked to increasing cantilever mean deflection and tip–surface proximity with increasing free amplitude in the L state. Cantilever dynamics in amplitude modulation AFM: Continuous and discontinuous transitions (PDF Download Available). Available from: https://www.researchgate.net/publication/231025693_Cantilever_dynamics_in_amplitude_modulation_AFM_Continuous_and_discontinuous_transitions [accessed Mar 27, 2017].