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Validation of SAR interferometric phase corrections in the squinted case for DEM quality enhancement
dc.contributor.author | Bara Iniesta, Marc Antoni |
dc.contributor.author | Prats Iraola, Pau |
dc.contributor.author | Mallorquí Franquet, Jordi Joan |
dc.contributor.author | López, J. |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions |
dc.date.accessioned | 2010-11-12T13:04:04Z |
dc.date.available | 2010-11-12T13:04:04Z |
dc.date.created | 2002-10 |
dc.date.issued | 2002-10 |
dc.identifier.citation | Bara, M. [et al.]. Validation of SAR interferometric phase corrections in the squinted case for DEM quality enhancement. "Electronics letters", Octubre 2002, vol. 38, núm. 22, p. 138-1381. |
dc.identifier.issn | 0013-5194 |
dc.identifier.uri | http://hdl.handle.net/2117/10271 |
dc.description.abstract | The focus of this report is synthetic aperturc radar (SAR) interferoinctric techniques for mapping applications, in the presencc of possible high squint values. Theoretical and expcrimental analysis show the presence of limitations that are overcome by the proposcd phase corrections. |
dc.format.extent | 1244 p. |
dc.language.iso | eng |
dc.subject | Àrees temàtiques de la UPC::Enginyeria de la telecomunicació |
dc.subject.lcsh | Synthetic aperture radar |
dc.subject.lcsh | Signal theory (Telecommunication) |
dc.subject.lcsh | Pulse techniques (Electronics) |
dc.title | Validation of SAR interferometric phase corrections in the squinted case for DEM quality enhancement |
dc.type | Article |
dc.subject.lemac | Senyal, Teoria del (Telecomunicació) |
dc.contributor.group | Universitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció |
dc.identifier.doi | 10.1049/el:20020894 |
dc.relation.publisherversion | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1047111 |
dc.rights.access | Open Access |
local.identifier.drac | 1648280 |
dc.description.version | Postprint (published version) |
local.citation.author | Bara, M.; Prats, P.; Mallorqui, J.J.; Lopez, J. |
local.citation.publicationName | Electronics letters |
local.citation.volume | 38 |
local.citation.number | 22 |
local.citation.startingPage | 138 |
local.citation.endingPage | 1381 |
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