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dc.contributor.authorBarlabe Dalmau, Antoni
dc.contributor.authorComerón Tejero, Adolfo
dc.contributor.authorPradell i Cara, Lluís
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.identifier.citationBarlabé, A; Comerón, A; Pradell, L. Generalized transverse resonance analysis of planar discontinuities considering the edge effect. IEEE Transactions on guided wave letters, 2000, vol.20, núm.12, p. 517-519
dc.description.abstractMode-matching related techniques such as the Generalized Transverse Resonance Method (GTR) suffer from the relative convergence phenomenon. To reduce its influence, we present a technique consisting of the application of basis functions incorporating the singular behavior of fields at edges and an optimal modal ratio. We present the results obtained analyzing a uniform finline and a short-circuited finline which demonstrate the minimization of the relative convergence phenomenon, allowing a fast and accurate analysis on a low-cost personal computer.
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació::Radiocomunicació i exploració electromagnètica::Circuits de microones, radiofreqüència i ones mil·limètriques
dc.subject.otherConvergence of numerical methods
dc.subject.otherFin lines
dc.subject.otherMode matching
dc.subject.otherPlanar waveguides
dc.subject.otherGeneralized transverse resonance analysis
dc.subject.otherPlanar discontinuities
dc.subject.otherEdge effect
dc.subject.otherRelative convergence phenomenon
dc.subject.otherMode-matching related technique
dc.subject.otherBasis functions
dc.subject.otherOptimal modal ratio
dc.subject.otherField singular behavior
dc.subject.otherUniform finline
dc.subject.otherShort-circuited finline
dc.subject.otherConvergence phenomenon minimisation
dc.titleGeneralized transverse resonance analysis of planar discontinuities considering the edge effect
dc.subject.lemacOnes -- Guies
dc.contributor.groupUniversitat Politècnica de Catalunya. RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access

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