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dc.contributor.authorJauregui Tellería, Ricardo
dc.contributor.authorSilva Martínez, Fernando
dc.contributor.authorOrlandi, Antonio
dc.contributor.authorSasse, Hugh
dc.contributor.authorDuffy, Alistair
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica
dc.date.accessioned2010-11-08T11:45:38Z
dc.date.available2010-11-08T11:45:38Z
dc.date.created2010
dc.date.issued2010
dc.identifier.citationJauregui, R. [et al.]. Factors influencing the successful validation of transient phenomenon modelling. A: Asia-Pacific International Symposium on Electromagnetic Compatibility. "The 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition". Beijing: IEEE Press. Institute of Electrical and Electronics Engineers, 2010, p. 338-341.
dc.identifier.urihttp://hdl.handle.net/2117/10168
dc.description.abstractAn increased requirement for validation of computational electromagnetic simulation and modelling through the publication of IEEE Standard 1597.1 brings to light some interesting issues surrounding the validation of transients. The structure of a transient event has three particular regions of interest that can have an influence on the results, of which only two are generally well defined. These are the initial quiescent phase from t = 0 to the transient event; the transient event itself up to the point where the energy has fallen to a predefined limit, and the post-transient phase where residual energy is still present in the system. This latter region is generally ill-defined and changes the way that a validation comparison should be made, from, for example a frequency domain coupling study where the region of interest is usually well defined. This study looks at the influence of the three regions on the validation results and suggests how the Feature Selective Validation (FSV) method can be applied in transient studies.
dc.format.extent4 p.
dc.language.isoeng
dc.publisherIEEE Press. Institute of Electrical and Electronics Engineers
dc.subjectÀrees temàtiques de la UPC::Enginyeria electrònica::Electrònica de potència
dc.subject.lcshComputational electromagnetics simulation
dc.subject.lcshElectromagnetic interference
dc.subject.lcshIEEE standards1597.1
dc.subject.lcshFrequency-domain analysis
dc.titleFactors influencing the successful validation of transient phenomenon modelling
dc.typeConference report
dc.subject.lemacElectromagnetisme -- Simulació per ordinador
dc.contributor.groupUniversitat Politècnica de Catalunya. IEB - Instrumentació Electrònica i Biomèdica
dc.identifier.doi10.1109/APEMC.2010.5475513
dc.description.peerreviewedPeer Reviewed
dc.rights.accessOpen Access
drac.iddocument3335728
dc.description.versionPostprint (published version)
upcommons.citation.authorJauregui, R.; Silva, F.; Orlandi, A.; Sasse, H.; Duffy, A.
upcommons.citation.contributorAsia-Pacific International Symposium on Electromagnetic Compatibility
upcommons.citation.pubplaceBeijing
upcommons.citation.publishedtrue
upcommons.citation.publicationNameThe 2010 Asia-Pacific Electromagnetic Compatibility Symposium and Technical Exhibition
upcommons.citation.startingPage338
upcommons.citation.endingPage341


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