Comparison of on-wafer calibrations using the concept of reference impedance
Document typeConference report
Publisher. MICROWAVE EXHIBITORS AND PUBLISHERS
Rights accessOpen Access
A novel method that allows to compare different calibration techniques has been developed. It is based on determining the reference impedance of a given Network Analyzer calibration from the reflection coefficient measurement of a physical open circuit. The method has been applied to several on-wafer calibrations.
CitationPurroy, F., Pradell, L. Comparison of on-wafer calibrations using the concept of reference impedance. A: EUROPEAN MICROWAVE CONFERENCE, EUMC'93. "?". . MICROWAVE EXHIBITORS AND PUBLISHERS, 1993, p. 857-859.