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dc.contributor.authorMallorquí Franquet, Jordi Joan
dc.contributor.authorAguasca Solé, Alberto
dc.contributor.authorRibó Vedrilla, Serni
dc.contributor.otherUniversitat Politècnica de Catalunya. Departament de Teoria del Senyal i Comunicacions
dc.date.accessioned2017-02-22T18:16:57Z
dc.date.available2017-02-22T18:16:57Z
dc.date.issued1999
dc.identifier.citationMallorqui, J.J., Aguasca, A., Ribó, S. Vectorial waveguide reflectometer for dielectric characterisation of materials under power microwaves. A: IEEE Antennas and Propagation Society International Symposium '99. "APS 1999: Antennas and Propagation Society International Symposium: July 11-16, 1999". Orlando: Institute of Electrical and Electronics Engineers (IEEE), 1999, p. 1950-1953.
dc.identifier.isbn14033-7955
dc.identifier.urihttp://hdl.handle.net/2117/101403
dc.description.abstractThe temperature rise in a material modifies its physical properties, particularly its dielectric permittivity. In many applications involving relatively high levels of power the electrical behavior of the different materials will change as they are heated by the radiation. For instance, the numerical codes that simulates the behavior of microwave heating processes in order to improve the design of the feeding antennas must take into account the load variations with temperature. The measurement of the changing dielectric characteristics of materials is of great interest for the industry. Previous works used completely filled waveguides near a shorting plate. The method supplied excellent results at low power levels, while the sample was not heated. When the power is risen, the field distribution of the TE/sub 10/ mode causes a non-uniform heating of the sample and the measured permittivity corresponds to an average value. In order to reduce this problem a method using a partially filled waveguide is presented. The reduced sample dimensions and its positioning into the waveguide assures a near homogeneous power distribution implying a uniform heating.
dc.format.extent4 p.
dc.language.isoeng
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.subjectÀrees temàtiques de la UPC::Enginyeria de la telecomunicació
dc.subject.lcshTelecommunication
dc.subject.otherPermittivity measurement
dc.subject.otherReflectometers
dc.subject.otherDielectric-loaded waveguides
dc.subject.otherMicrowave reflectometry
dc.subject.otherWaveguide theory
dc.subject.otherDielectric properties
dc.titleVectorial waveguide reflectometer for dielectric characterisation of materials under power microwaves
dc.typeConference report
dc.subject.lemacTelecomunicació
dc.contributor.groupUniversitat Politècnica de Catalunya. RSLAB - Grup de Recerca en Teledetecció
dc.identifier.doi10.1109/APS.1999.788340
dc.description.peerreviewedPeer Reviewed
dc.relation.publisherversionhttp://ieeexplore.ieee.org/document/788340/
dc.rights.accessOpen Access
local.identifier.drac2357371
dc.description.versionPostprint (published version)
local.citation.authorMallorqui, J.J.; Aguasca, A.; Ribó, S.
local.citation.contributorIEEE Antennas and Propagation Society International Symposium '99
local.citation.pubplaceOrlando
local.citation.publicationNameAPS 1999: Antennas and Propagation Society International Symposium: July 11-16, 1999
local.citation.startingPage1950
local.citation.endingPage1953


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