Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach
Tipo de documentoTexto en actas de congreso
Fecha de publicación1992
Editor. MICROWAVE EXHIBITIONS AND PUBLISHERS
Condiciones de accesoAcceso abierto
Network Analyzer self-calibration techniques - TRL, LMR, TAR- are developed, implemented and compared in several transmission media. A novel LMR (Line-Match-Reflect) technique based on known LINE and REFLECT Standards, is proposed and compared to conventional LMR (based on known LINE and MATCH Standards) and other techniques (TRL, TAR). They are applied to on-wafer S-parameter measurement as well as to coaxial, waveguide and microstrip media. Experimental results up to 40 GHz are presented.
CitaciónPradell, L., Purroy, F., Cáceres, M. Development of self-calibration techniques for on-wafer and fixtured measurements: a novel approach. A: European Microwave Conference. "EuMC 1992: 22nd European Microwave Conference: September 5-9, 1992". Espoo: . MICROWAVE EXHIBITIONS AND PUBLISHERS, 1992, p. 919-924.
Versión del editorhttp://ieeexplore.ieee.org/document/4135567/