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MOSFET dynamic thermal sensor for IC testing applications

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10.1016/j.sna.2016.03.016
 
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hdl:2117/100287

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Reverter Cubarsí, FerranMés informacióMés informacióMés informació
Perpiñà Gilabet, Xavier
Barajas Ojeda, EnriqueMés informacióMés informacióMés informació
León, Javier
Vellvehi, Miquel
Jordà, Xavier
Altet Sanahujes, JosepMés informacióMés informacióMés informació
Document typeArticle
Defense date2016-05-01
Rights accessOpen Access
Attribution-NonCommercial-NoDerivs 3.0 Spain
Except where otherwise noted, content on this work is licensed under a Creative Commons license : Attribution-NonCommercial-NoDerivs 3.0 Spain
Abstract
This paper analyses how a single metal-oxide-semiconductor field-effect transistor (MOSFET) can be employed as a thermal sensor to measure on-chip dynamic thermal signals caused by a power-dissipating circuit under test (CUT). The measurement is subjected to two low-pass filters (LPF). The first LPF depends on the thermal properties of the heat-conduction medium (i.e. silicon) and the CUT-sensor distance, whereas the second depends on the electrical properties of the sensing circuit such as the bias current and the dimensions of the MOSFET sensor. This is evaluated along the paper through theoretical models, simulations, and experimental data resulting from a chip fabricated in 0.35 mu m CMOS technology. Finally, the proposed thermal sensor and the knowledge extracted from this paper are applied to estimate the linearity of a radio-frequency (RF) amplifier. (C) 2016 Elsevier B.V. All rights reserved.
CitationReverter, F., Perpiñà, X., Barajas, E., León, J., Vellvehi, M., Jordà, X., Altet, J. MOSFET dynamic thermal sensor for IC testing applications. "Sensors and actuators A. Physical", 1 Maig 2016, vol. 242, p. 195-202. 
URIhttp://hdl.handle.net/2117/100287
DOI10.1016/j.sna.2016.03.016
ISSN0924-4247
Publisher versionhttp://www.sciencedirect.com/science/article/pii/S0924424716301145
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  • HIPICS - High Performance Integrated Circuits and Systems - Articles de revista [90]
  • e-CAT - Circuits i Transductors Electrònics - Articles de revista [24]
  • Departament d'Enginyeria Electrònica - Articles de revista [1.531]
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