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Calibration-less direct capacitor-to-microcontroller interface
dc.contributor.author | López Lapeña, Oscar |
dc.contributor.author | Serrano Finetti, Roberto Ernesto |
dc.contributor.author | Casas Piedrafita, Óscar |
dc.contributor.other | Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica |
dc.date.accessioned | 2017-01-30T12:00:04Z |
dc.date.available | 2017-01-30T12:00:04Z |
dc.date.issued | 2016-02-18 |
dc.identifier.citation | Lopez-Lapeña, O., Serrano, R., Casas, J.O. Calibration-less direct capacitor-to-microcontroller interface. "Electronics Letters", 18 Febrer 2016, vol. 52, núm. 4, p. 289-291. |
dc.identifier.issn | 0013-5194 |
dc.identifier.uri | http://hdl.handle.net/2117/100282 |
dc.description.abstract | A new technique to measure a capacitor or a capacitive sensor by means of a direct sensor-to-microcontroller interface circuit that does not need a calibration capacitor is proposed. Basically, the measurement process consists of three consecutive steps of charge, discharge and charge of the capacitor under test. A non-linear equation is obtained and solved that is dependent only on known circuit parameters. Experimental results show that it is possible to measure a wide range of capacitor values with a maximum deviation of 2% from the reference value, and that temperature changes from 18 to 70°C yield relative errors below 0.1%. For the lowest measured capacitor range (33 pF-4.7 nF) the uncertainty holds below 1 pF which enables measurement of commercially available capacitive sensors. The main advantage of the proposed technique is cost and space reduction of the final design. |
dc.format.extent | 3 p. |
dc.language.iso | eng |
dc.publisher | Institution of Electrical Engineers |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
dc.subject | Àrees temàtiques de la UPC::Enginyeria electrònica |
dc.subject.lcsh | Microcontrollers |
dc.subject.lcsh | Detectors |
dc.subject.other | capacitance 33 nF to 4.7 nF |
dc.subject.other | calibrationless direct capacitor-to-microcontroller interface |
dc.subject.other | capacitive sensor |
dc.subject.other | capacitor measurement |
dc.subject.other | direct sensor-to-microcontroller interface circuit |
dc.subject.other | measurement process |
dc.subject.other | capacitor charge |
dc.subject.other | capacitor discharge |
dc.subject.other | nonlinear equation |
dc.subject.other | reference value |
dc.subject.other | space reduction |
dc.subject.other | cost reduction |
dc.subject.other | temperature 18 degC to 70 degC |
dc.title | Calibration-less direct capacitor-to-microcontroller interface |
dc.type | Article |
dc.subject.lemac | Detectors |
dc.subject.lemac | Microcontroladors |
dc.contributor.group | Universitat Politècnica de Catalunya. GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies |
dc.identifier.doi | 10.1049/el.2015.3706 |
dc.description.peerreviewed | Peer Reviewed |
dc.relation.publisherversion | http://ieeexplore.ieee.org/document/7405380/ |
dc.rights.access | Open Access |
local.identifier.drac | 17708071 |
dc.description.version | Postprint (author's final draft) |
local.citation.author | Lopez-Lapeña, O.; Serrano, R.; Casas, J.O. |
local.citation.publicationName | Electronics Letters |
local.citation.volume | 52 |
local.citation.number | 4 |
local.citation.startingPage | 289 |
local.citation.endingPage | 291 |
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