Goodness of fit tests for the skew-Laplace distribution
Document typeArticle
Defense date2007
PublisherInstitut d'Estadística de Catalunya
Rights accessOpen Access
Except where otherwise noted, content on this work
is licensed under a Creative Commons license
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Attribution-NonCommercial-NoDerivs 2.5 Spain
Abstract
The skew-Laplace distribution is frequently used to fit the logarithm of particle sizes and it is also used in Economics, Engineering, Finance and Biology. We show the Anderson-Darling and Cram´ er-von
Mises goodness of fit tests for this distribution.
CitationPuig, Pedro; Stephens, Michael A.. "Goodness of fit tests for the skew-Laplace distribution". SORT, 2007, Vol. 31, núm. 1
ISSN1696-2281